Impact of DC bias on weak optical-field-driven electron emission in nano-vacuum-gap detectors

Impact of DC bias on weak optical-field-driven electron emission in nano-vacuum-gap detectors

Bibliographic Details
Main Authors:	Turchetti, Marco, Bionta, Mina R, Yang, Yujia, Ritzkowsky, Felix, Candido, Denis R, Flatté, Michael E, Berggren, Karl K, Keathley, Phillip D
Other Authors:	Massachusetts Institute of Technology. Research Laboratory of Electronics
Format:	Article
Language:	English
Published:	The Optical Society 2022
Online Access:	https://hdl.handle.net/1721.1/142778

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