Graph Pattern Detection: Hardness for all Induced Patterns and Faster Noninduced Cycles
| Main Authors: | , , |
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| Other Authors: | |
| Format: | Article |
| Language: | English |
| Published: |
Society for Industrial & Applied Mathematics (SIAM)
2022
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| Online Access: | https://hdl.handle.net/1721.1/143941 |
| _version_ | 1826194781106077696 |
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| author | Dalirrooyfard, Mina Vuong, Thuy Duong Williams, Virginia Vassilevska |
| author2 | Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science |
| author_facet | Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science Dalirrooyfard, Mina Vuong, Thuy Duong Williams, Virginia Vassilevska |
| author_sort | Dalirrooyfard, Mina |
| collection | MIT |
| first_indexed | 2024-09-23T10:01:42Z |
| format | Article |
| id | mit-1721.1/143941 |
| institution | Massachusetts Institute of Technology |
| language | English |
| last_indexed | 2024-09-23T10:01:42Z |
| publishDate | 2022 |
| publisher | Society for Industrial & Applied Mathematics (SIAM) |
| record_format | dspace |
| spelling | mit-1721.1/1439412023-12-06T21:49:25Z Graph Pattern Detection: Hardness for all Induced Patterns and Faster Noninduced Cycles Dalirrooyfard, Mina Vuong, Thuy Duong Williams, Virginia Vassilevska Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science Massachusetts Institute of Technology. Computer Science and Artificial Intelligence Laboratory 2022-07-21T16:44:14Z 2022-07-21T16:44:14Z 2021 2022-07-21T16:35:37Z Article http://purl.org/eprint/type/JournalArticle https://hdl.handle.net/1721.1/143941 Dalirrooyfard, Mina, Vuong, Thuy Duong and Williams, Virginia Vassilevska. 2021. "Graph Pattern Detection: Hardness for all Induced Patterns and Faster Noninduced Cycles." SIAM Journal on Computing, 50 (5). en 10.1137/20M1335054 SIAM Journal on Computing Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use. application/pdf Society for Industrial & Applied Mathematics (SIAM) SIAM |
| spellingShingle | Dalirrooyfard, Mina Vuong, Thuy Duong Williams, Virginia Vassilevska Graph Pattern Detection: Hardness for all Induced Patterns and Faster Noninduced Cycles |
| title | Graph Pattern Detection: Hardness for all Induced Patterns and Faster Noninduced Cycles |
| title_full | Graph Pattern Detection: Hardness for all Induced Patterns and Faster Noninduced Cycles |
| title_fullStr | Graph Pattern Detection: Hardness for all Induced Patterns and Faster Noninduced Cycles |
| title_full_unstemmed | Graph Pattern Detection: Hardness for all Induced Patterns and Faster Noninduced Cycles |
| title_short | Graph Pattern Detection: Hardness for all Induced Patterns and Faster Noninduced Cycles |
| title_sort | graph pattern detection hardness for all induced patterns and faster noninduced cycles |
| url | https://hdl.handle.net/1721.1/143941 |
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