Graph Pattern Detection: Hardness for all Induced Patterns and Faster Noninduced Cycles

Graph Pattern Detection: Hardness for all Induced Patterns and Faster Noninduced Cycles

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Bibliographic Details
Main Authors: Dalirrooyfard, Mina, Vuong, Thuy Duong, Williams, Virginia Vassilevska
Other Authors: Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
Format: Article
Language:English
Published: Society for Industrial & Applied Mathematics (SIAM) 2022
Online Access:https://hdl.handle.net/1721.1/143941

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