Assessment of optical phonons in BeTe, BexZn1-xTe, p-BeTe epilayers and BeTe/ZnTe/GaAs (001) superlattices
Comprehensive simulations for the polarization-dependent far-infrared (FIR) reflectance and transmission spectra are reported to assess the longitudinal-optical (ωLO) and transverse-optical (ωTO) phonons in binary BeTe (ZnTe)/GaAs (001), ternary alloy BexZn1-xTe/GaAs (001) epilayers and BeTe/ZnTe/Ga...
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| Format: | Article |
| Language: | English |
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Springer Berlin Heidelberg
2022
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| Online Access: | https://hdl.handle.net/1721.1/143951 |
| _version_ | 1811085898648911872 |
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| author | Talwar, Devki N. Becla, P. |
| author2 | Massachusetts Institute of Technology. Department of Materials Science and Engineering |
| author_facet | Massachusetts Institute of Technology. Department of Materials Science and Engineering Talwar, Devki N. Becla, P. |
| author_sort | Talwar, Devki N. |
| collection | MIT |
| description | Comprehensive simulations for the polarization-dependent far-infrared (FIR) reflectance and transmission spectra are reported to assess the longitudinal-optical (ωLO) and transverse-optical (ωTO) phonons in binary BeTe (ZnTe)/GaAs (001), ternary alloy BexZn1-xTe/GaAs (001) epilayers and BeTe/ZnTe/GaAs (001) superlattices. The Kramers–Krönig analyses are performed to achieve the optical constants of bulk materials for constructing their frequency dependent dielectric functions. Both s-[Ts(ω)/Rs(ω)] and p-[Tp(ω)/Rp(ω)] polarized spectral calculations are attained at an oblique incidence [i.e., Berreman effect (BE)] using a three-phase model in a multilayer optics approach. For perfect thin epilayers, the BE method has offered an unambiguous appraisal of ωLO and ωTO phonons in the p-polarized [Tp(ω)/Rp(ω)] FIR spectra; while in the p-doped BeTe epilayer, it justified the LO–plasmon (ω+LOPL) coupled modes to be longitudinal in character. Careful assessment of the ω+LOPL by FIR spectroscopy offers an alternative, elegant and effective method, complementary to Raman scattering spectroscopy for estimating the free-carrier charge density η in technologically important doped semiconductor epilayers. |
| first_indexed | 2024-09-23T13:16:58Z |
| format | Article |
| id | mit-1721.1/143951 |
| institution | Massachusetts Institute of Technology |
| language | English |
| last_indexed | 2024-09-23T13:16:58Z |
| publishDate | 2022 |
| publisher | Springer Berlin Heidelberg |
| record_format | dspace |
| spelling | mit-1721.1/1439512023-08-03T04:26:20Z Assessment of optical phonons in BeTe, BexZn1-xTe, p-BeTe epilayers and BeTe/ZnTe/GaAs (001) superlattices Talwar, Devki N. Becla, P. Massachusetts Institute of Technology. Department of Materials Science and Engineering Comprehensive simulations for the polarization-dependent far-infrared (FIR) reflectance and transmission spectra are reported to assess the longitudinal-optical (ωLO) and transverse-optical (ωTO) phonons in binary BeTe (ZnTe)/GaAs (001), ternary alloy BexZn1-xTe/GaAs (001) epilayers and BeTe/ZnTe/GaAs (001) superlattices. The Kramers–Krönig analyses are performed to achieve the optical constants of bulk materials for constructing their frequency dependent dielectric functions. Both s-[Ts(ω)/Rs(ω)] and p-[Tp(ω)/Rp(ω)] polarized spectral calculations are attained at an oblique incidence [i.e., Berreman effect (BE)] using a three-phase model in a multilayer optics approach. For perfect thin epilayers, the BE method has offered an unambiguous appraisal of ωLO and ωTO phonons in the p-polarized [Tp(ω)/Rp(ω)] FIR spectra; while in the p-doped BeTe epilayer, it justified the LO–plasmon (ω+LOPL) coupled modes to be longitudinal in character. Careful assessment of the ω+LOPL by FIR spectroscopy offers an alternative, elegant and effective method, complementary to Raman scattering spectroscopy for estimating the free-carrier charge density η in technologically important doped semiconductor epilayers. 2022-07-22T11:49:34Z 2022-07-22T11:49:34Z 2022-07-21 2022-07-22T03:14:17Z Article http://purl.org/eprint/type/JournalArticle https://hdl.handle.net/1721.1/143951 Applied Physics A. 2022 Jul 21;128(8):702 en https://doi.org/10.1007/s00339-022-05819-z Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use. The Author(s), under exclusive licence to Springer-Verlag GmbH, DE part of Springer Nature application/pdf Springer Berlin Heidelberg Springer Berlin Heidelberg |
| spellingShingle | Talwar, Devki N. Becla, P. Assessment of optical phonons in BeTe, BexZn1-xTe, p-BeTe epilayers and BeTe/ZnTe/GaAs (001) superlattices |
| title | Assessment of optical phonons in BeTe, BexZn1-xTe, p-BeTe epilayers and BeTe/ZnTe/GaAs (001) superlattices |
| title_full | Assessment of optical phonons in BeTe, BexZn1-xTe, p-BeTe epilayers and BeTe/ZnTe/GaAs (001) superlattices |
| title_fullStr | Assessment of optical phonons in BeTe, BexZn1-xTe, p-BeTe epilayers and BeTe/ZnTe/GaAs (001) superlattices |
| title_full_unstemmed | Assessment of optical phonons in BeTe, BexZn1-xTe, p-BeTe epilayers and BeTe/ZnTe/GaAs (001) superlattices |
| title_short | Assessment of optical phonons in BeTe, BexZn1-xTe, p-BeTe epilayers and BeTe/ZnTe/GaAs (001) superlattices |
| title_sort | assessment of optical phonons in bete bexzn1 xte p bete epilayers and bete znte gaas 001 superlattices |
| url | https://hdl.handle.net/1721.1/143951 |
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