Testing, Learning, and Optimization in High Dimensions

In this thesis we study two separate problems: (1) What is the sample complexity of testing the class of Determinantal Point Processes? and (2) Introducing a new analysis for optimization and generalization of deep neural networks beyond their linear approximation. For the first problem, we characte...

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Main Author: Gatmiry, Khashayar
Other Authors: Stefanie Jegelka
Format: Thesis
Published: Massachusetts Institute of Technology 2022
Online Access:https://hdl.handle.net/1721.1/144927
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author Gatmiry, Khashayar
author2 Stefanie Jegelka
author_facet Stefanie Jegelka
Gatmiry, Khashayar
author_sort Gatmiry, Khashayar
collection MIT
description In this thesis we study two separate problems: (1) What is the sample complexity of testing the class of Determinantal Point Processes? and (2) Introducing a new analysis for optimization and generalization of deep neural networks beyond their linear approximation. For the first problem, we characterize the optimal sample complexity up to logarithmic factors by proposing almost matching upper and lower bounds. For the second problem, we propose a new regime for the parameters and the algorithm of a three layer network model which goes beyond the Neural tangent kernel (NTK) approximation; as a result, we introduce a new data dependent complexity measure which generalizes the NTK complexity measure introduced by [Arora et al., 2019a]. We show that despite nonconvexity, a variant of Stochastic gradient descent (SGD) converges to a good solution for which we prove a novel generalization bound that is proportional to our complexity measure.
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spelling mit-1721.1/1449272022-08-30T03:52:03Z Testing, Learning, and Optimization in High Dimensions Gatmiry, Khashayar Stefanie Jegelka Kelner, Jonathan Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science In this thesis we study two separate problems: (1) What is the sample complexity of testing the class of Determinantal Point Processes? and (2) Introducing a new analysis for optimization and generalization of deep neural networks beyond their linear approximation. For the first problem, we characterize the optimal sample complexity up to logarithmic factors by proposing almost matching upper and lower bounds. For the second problem, we propose a new regime for the parameters and the algorithm of a three layer network model which goes beyond the Neural tangent kernel (NTK) approximation; as a result, we introduce a new data dependent complexity measure which generalizes the NTK complexity measure introduced by [Arora et al., 2019a]. We show that despite nonconvexity, a variant of Stochastic gradient descent (SGD) converges to a good solution for which we prove a novel generalization bound that is proportional to our complexity measure. S.M. 2022-08-29T16:21:31Z 2022-08-29T16:21:31Z 2022-05 2022-06-21T19:25:24.953Z Thesis https://hdl.handle.net/1721.1/144927 In Copyright - Educational Use Permitted Copyright MIT http://rightsstatements.org/page/InC-EDU/1.0/ application/pdf Massachusetts Institute of Technology
spellingShingle Gatmiry, Khashayar
Testing, Learning, and Optimization in High Dimensions
title Testing, Learning, and Optimization in High Dimensions
title_full Testing, Learning, and Optimization in High Dimensions
title_fullStr Testing, Learning, and Optimization in High Dimensions
title_full_unstemmed Testing, Learning, and Optimization in High Dimensions
title_short Testing, Learning, and Optimization in High Dimensions
title_sort testing learning and optimization in high dimensions
url https://hdl.handle.net/1721.1/144927
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