Elucidating proximity magnetism through polarized neutron reflectometry and machine learning

<jats:p> Polarized neutron reflectometry is a powerful technique to interrogate the structures of multilayered magnetic materials with depth sensitivity and nanometer resolution. However, reflectometry profiles often inhabit a complicated objective function landscape using traditional fitting...

詳細記述

書誌詳細
主要な著者: Andrejevic, Nina, Chen, Zhantao, Nguyen, Thanh, Fan, Leon, Heiberger, Henry, Zhou, Ling-Jie, Zhao, Yi-Fan, Chang, Cui-Zu, Grutter, Alexander, Li, Mingda
その他の著者: Massachusetts Institute of Technology. Department of Materials Science and Engineering
フォーマット: 論文
言語:English
出版事項: AIP Publishing 2022
オンライン・アクセス:https://hdl.handle.net/1721.1/145472