The Optimal Error Resilience of Interactive Communication over Binary Channels

The Optimal Error Resilience of Interactive Communication over Binary Channels

Bibliographic Details
Main Authors:	Zhang, Rachel, Gupta, Meghal
Other Authors:	Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
Format:	Article
Language:	English
Published:	ACM\|Proceedings of the 54th Annual ACM SIGACT Symposium on Theory of Computing 2022
Online Access:	https://hdl.handle.net/1721.1/146448

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