Understanding the fundamental driver of semiconductor radiation tolerance with experiment and theory

Understanding the fundamental driver of semiconductor radiation tolerance with experiment and theory

Bibliographic Details
Main Authors: Logan, Julie V, Webster, Preston T, Woller, Kevin B, Morath, Christian P, Short, Michael P
Other Authors: Massachusetts Institute of Technology. Department of Nuclear Science and Engineering
Format: Article
Language:English
Published: American Physical Society (APS) 2023
Online Access:https://hdl.handle.net/1721.1/147619

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