Leakage-Biased Domino Circuits for Dynamic Fine-Grain Leakage Reduction

Bibliographic Details
Main Authors: Heo, Seongmoo, Asanovi_, Krste
Published: 2023
Online Access:https://hdl.handle.net/1721.1/149934
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author Heo, Seongmoo
Asanovi_, Krste
author_facet Heo, Seongmoo
Asanovi_, Krste
author_sort Heo, Seongmoo
collection MIT
first_indexed 2024-09-23T14:40:26Z
id mit-1721.1/149934
institution Massachusetts Institute of Technology
last_indexed 2024-09-23T14:40:26Z
publishDate 2023
record_format dspace
spelling mit-1721.1/1499342023-03-30T03:23:29Z Leakage-Biased Domino Circuits for Dynamic Fine-Grain Leakage Reduction Heo, Seongmoo Asanovi_, Krste 2023-03-29T15:35:02Z 2023-03-29T15:35:02Z 2002-01 https://hdl.handle.net/1721.1/149934 MIT-LCS-TR-831 application/pdf
spellingShingle Heo, Seongmoo
Asanovi_, Krste
Leakage-Biased Domino Circuits for Dynamic Fine-Grain Leakage Reduction
title Leakage-Biased Domino Circuits for Dynamic Fine-Grain Leakage Reduction
title_full Leakage-Biased Domino Circuits for Dynamic Fine-Grain Leakage Reduction
title_fullStr Leakage-Biased Domino Circuits for Dynamic Fine-Grain Leakage Reduction
title_full_unstemmed Leakage-Biased Domino Circuits for Dynamic Fine-Grain Leakage Reduction
title_short Leakage-Biased Domino Circuits for Dynamic Fine-Grain Leakage Reduction
title_sort leakage biased domino circuits for dynamic fine grain leakage reduction
url https://hdl.handle.net/1721.1/149934
work_keys_str_mv AT heoseongmoo leakagebiaseddominocircuitsfordynamicfinegrainleakagereduction
AT asanovikrste leakagebiaseddominocircuitsfordynamicfinegrainleakagereduction