Principles of Laser Alignment in Atomic Force Microscopy and its Potential Application for Nanoscale 3D Printing
Atomic Force Microscopy (AFM) is a well-established technique that has played a significant role in the characterization of nanoscale structures. While its applications in surface profiling and imaging of nanomaterials are widely recognized, the potential of AFM techniques in 3D printing application...
| Main Author: | |
|---|---|
| Other Authors: | |
| Format: | Thesis |
| Published: |
Massachusetts Institute of Technology
2023
|
| Online Access: | https://hdl.handle.net/1721.1/152132 |