The application of Moire interferometry to automated 3-dimensional inspection

Thesis (M.S.)--Massachusetts Institute of Technology, Dept. of Mechanical Engineering, 1985.

Bibliographic Details
Main Author: Wander, Joseph M
Other Authors: Steven Dubowsky.
Format: Thesis
Language:eng
Published: Massachusetts Institute of Technology 2005
Subjects:
Online Access:http://hdl.handle.net/1721.1/15264
Description
Summary:Thesis (M.S.)--Massachusetts Institute of Technology, Dept. of Mechanical Engineering, 1985.