The Effect of Joint Thickness on Intermetallic Growth in the In52Sn48(Liquid)/Cu(Solid) Diffusion Couple

Abstract Intermetallic growth can simultaneously enable low-resistance electrical pathways and determine the lifetime of a solder joint. Motivating this work is a demountable linear bilateral solder joint application, enabled via a vacuum pressure impregnation process. The effect of the...

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Bibliographic Details
Main Author: Mouratidis, Theodore
Other Authors: Massachusetts Institute of Technology. Plasma Science and Fusion Center
Format: Article
Language:English
Published: Springer US 2023
Online Access:https://hdl.handle.net/1721.1/152964

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