External field effects on electronic and ionic defects in functional oxides: Experiments and simulations

Understanding the effects of external stimuli on electronic and ionic defects in functional oxides is the key to design next generation energy conversion/storage and memory devices. Mechanical strain and high electric fields are known to commonly exist in thin film functional oxides and significantl...

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Bibliographic Details
Main Author: Chi, Yen-Ting
Other Authors: Vliet, Krystyn J. Van
Format: Thesis
Published: Massachusetts Institute of Technology 2023
Online Access:https://hdl.handle.net/1721.1/153048