Evaluating Phonon Characteristics by Varying the Layer and Interfacial Thickness in Novel Carbon-Based Strained-Layer Superlattices

Systematic results of lattice dynamical calculations are reported as a function of m and n for the novel (SiC)<sub>m</sub>/(GeC)<sub>n</sub> superlattices (SLs) by exploiting a modified linear-chain model and a realistic rigid-ion model (RIM). A bond polarizability method is...

Full description

Bibliographic Details
Main Authors: Talwar, Devki N., Becla, Piotr
Other Authors: Massachusetts Institute of Technology. Department of Materials Science and Engineering
Format: Article
Published: Multidisciplinary Digital Publishing Institute 2023
Online Access:https://hdl.handle.net/1721.1/153235
_version_ 1811084931327066112
author Talwar, Devki N.
Becla, Piotr
author2 Massachusetts Institute of Technology. Department of Materials Science and Engineering
author_facet Massachusetts Institute of Technology. Department of Materials Science and Engineering
Talwar, Devki N.
Becla, Piotr
author_sort Talwar, Devki N.
collection MIT
description Systematic results of lattice dynamical calculations are reported as a function of m and n for the novel (SiC)<sub>m</sub>/(GeC)<sub>n</sub> superlattices (SLs) by exploiting a modified linear-chain model and a realistic rigid-ion model (RIM). A bond polarizability method is employed to simulate the Raman intensity profiles (RIPs) for both the ideal and graded (SiC)<sub>10-&Delta;</sub>/(Si<sub>0.5</sub>Ge<sub>0.5</sub>C)<sub>&Delta;</sub>/(GeC)<sub>10-&Delta;</sub>/(Si<sub>0.5</sub>Ge<sub>0.5</sub>C)<sub>&Delta;</sub> SLs. We have adopted a virtual-crystal approximation for describing the interfacial layer thickness, &Delta; (&equiv;0, 1, 2, and 3 monolayers (MLs)) by selecting equal proportions of SiC and GeC layers. Systematic variation of &Delta; has initiated considerable upward (downward) shifts of GeC-(SiC)-like Raman peaks in the optical phonon frequency regions. Our simulated results of RIPs in SiC/GeC SLs are agreed reasonably well with the recent analyses of Raman scattering data on graded short-period GaN/AlN SLs. Maximum changes in the calculated optical phonons (up to &plusmn;~47 cm<sup>&minus;1</sup>) with &Delta; = 3, are proven effective for causing accidental degeneracies and instigating localization of atomic displacements at the transition regions of the SLs. Strong &Delta;-dependent enhancement of Raman intensity features in SiC/GeC are considered valuable for validating the interfacial constituents in other technologically important heterostructures. By incorporating RIM, we have also studied the phonon dispersions [<inline-formula><math xmlns="http://www.w3.org/1998/Math/MathML" display="inline"><semantics><mrow><msub><mrow><msubsup><mrow><msub><mrow><mi mathvariant="sans-serif">&omega;</mi></mrow><mrow></mrow></msub></mrow><mrow><mi mathvariant="normal">j</mi></mrow><mrow><mi mathvariant="normal">S</mi><mi mathvariant="normal">L</mi></mrow></msubsup></mrow><mrow></mrow></msub><mfenced separators="|"><mrow><mover accent="true"><mrow><mi mathvariant="bold">q</mi></mrow><mo>&rarr;</mo></mover></mrow></mfenced></mrow></semantics></math></inline-formula>] of (SiC)<sub>m</sub>/(GeC)<sub>n</sub> SLs along the growth [001] as well as in-plane [100], [110] directions [i.e., perpendicular to the growth]. In the acoustic mode regions, our results of <inline-formula><math xmlns="http://www.w3.org/1998/Math/MathML" display="inline"><semantics><mrow><msub><mrow><msubsup><mrow><msub><mrow><mi mathvariant="sans-serif">&omega;</mi></mrow><mrow></mrow></msub></mrow><mrow><mi mathvariant="normal">j</mi></mrow><mrow><mi mathvariant="normal">S</mi><mi mathvariant="normal">L</mi></mrow></msubsup></mrow><mrow></mrow></msub><mfenced separators="|"><mrow><mover accent="true"><mrow><mi mathvariant="bold">q</mi></mrow><mo>&rarr;</mo></mover></mrow></mfenced><mo>&nbsp;</mo></mrow></semantics></math></inline-formula> have confirmed the formation of mini-gaps at the zone center and zone edges while providing strong evidences of the anti-crossing and phonon confinements. Besides examining the angular dependence of zone-center optical modes, the results of phonon folding, confinement, and anisotropic behavior in (SiC)<sub>m</sub>/(GeC)<sub>n</sub> are compared and contrasted very well with the recent first-principles calculations of (GaN)<sub>m</sub>/(AlN)<sub>n</sub> strained layer SLs.
first_indexed 2024-09-23T13:00:18Z
format Article
id mit-1721.1/153235
institution Massachusetts Institute of Technology
last_indexed 2024-09-23T13:00:18Z
publishDate 2023
publisher Multidisciplinary Digital Publishing Institute
record_format dspace
spelling mit-1721.1/1532352024-01-24T21:57:10Z Evaluating Phonon Characteristics by Varying the Layer and Interfacial Thickness in Novel Carbon-Based Strained-Layer Superlattices Talwar, Devki N. Becla, Piotr Massachusetts Institute of Technology. Department of Materials Science and Engineering Systematic results of lattice dynamical calculations are reported as a function of m and n for the novel (SiC)<sub>m</sub>/(GeC)<sub>n</sub> superlattices (SLs) by exploiting a modified linear-chain model and a realistic rigid-ion model (RIM). A bond polarizability method is employed to simulate the Raman intensity profiles (RIPs) for both the ideal and graded (SiC)<sub>10-&Delta;</sub>/(Si<sub>0.5</sub>Ge<sub>0.5</sub>C)<sub>&Delta;</sub>/(GeC)<sub>10-&Delta;</sub>/(Si<sub>0.5</sub>Ge<sub>0.5</sub>C)<sub>&Delta;</sub> SLs. We have adopted a virtual-crystal approximation for describing the interfacial layer thickness, &Delta; (&equiv;0, 1, 2, and 3 monolayers (MLs)) by selecting equal proportions of SiC and GeC layers. Systematic variation of &Delta; has initiated considerable upward (downward) shifts of GeC-(SiC)-like Raman peaks in the optical phonon frequency regions. Our simulated results of RIPs in SiC/GeC SLs are agreed reasonably well with the recent analyses of Raman scattering data on graded short-period GaN/AlN SLs. Maximum changes in the calculated optical phonons (up to &plusmn;~47 cm<sup>&minus;1</sup>) with &Delta; = 3, are proven effective for causing accidental degeneracies and instigating localization of atomic displacements at the transition regions of the SLs. Strong &Delta;-dependent enhancement of Raman intensity features in SiC/GeC are considered valuable for validating the interfacial constituents in other technologically important heterostructures. By incorporating RIM, we have also studied the phonon dispersions [<inline-formula><math xmlns="http://www.w3.org/1998/Math/MathML" display="inline"><semantics><mrow><msub><mrow><msubsup><mrow><msub><mrow><mi mathvariant="sans-serif">&omega;</mi></mrow><mrow></mrow></msub></mrow><mrow><mi mathvariant="normal">j</mi></mrow><mrow><mi mathvariant="normal">S</mi><mi mathvariant="normal">L</mi></mrow></msubsup></mrow><mrow></mrow></msub><mfenced separators="|"><mrow><mover accent="true"><mrow><mi mathvariant="bold">q</mi></mrow><mo>&rarr;</mo></mover></mrow></mfenced></mrow></semantics></math></inline-formula>] of (SiC)<sub>m</sub>/(GeC)<sub>n</sub> SLs along the growth [001] as well as in-plane [100], [110] directions [i.e., perpendicular to the growth]. In the acoustic mode regions, our results of <inline-formula><math xmlns="http://www.w3.org/1998/Math/MathML" display="inline"><semantics><mrow><msub><mrow><msubsup><mrow><msub><mrow><mi mathvariant="sans-serif">&omega;</mi></mrow><mrow></mrow></msub></mrow><mrow><mi mathvariant="normal">j</mi></mrow><mrow><mi mathvariant="normal">S</mi><mi mathvariant="normal">L</mi></mrow></msubsup></mrow><mrow></mrow></msub><mfenced separators="|"><mrow><mover accent="true"><mrow><mi mathvariant="bold">q</mi></mrow><mo>&rarr;</mo></mover></mrow></mfenced><mo>&nbsp;</mo></mrow></semantics></math></inline-formula> have confirmed the formation of mini-gaps at the zone center and zone edges while providing strong evidences of the anti-crossing and phonon confinements. Besides examining the angular dependence of zone-center optical modes, the results of phonon folding, confinement, and anisotropic behavior in (SiC)<sub>m</sub>/(GeC)<sub>n</sub> are compared and contrasted very well with the recent first-principles calculations of (GaN)<sub>m</sub>/(AlN)<sub>n</sub> strained layer SLs. 2023-12-22T15:34:55Z 2023-12-22T15:34:55Z 2023-10-01 2023-12-22T13:45:01Z Article http://purl.org/eprint/type/JournalArticle https://hdl.handle.net/1721.1/153235 Solids 4 (4): 287-303 (2023) PUBLISHER_CC http://dx.doi.org/10.3390/solids4040018 Creative Commons Attribution https://creativecommons.org/licenses/by/4.0/ application/pdf Multidisciplinary Digital Publishing Institute Multidisciplinary Digital Publishing Institute
spellingShingle Talwar, Devki N.
Becla, Piotr
Evaluating Phonon Characteristics by Varying the Layer and Interfacial Thickness in Novel Carbon-Based Strained-Layer Superlattices
title Evaluating Phonon Characteristics by Varying the Layer and Interfacial Thickness in Novel Carbon-Based Strained-Layer Superlattices
title_full Evaluating Phonon Characteristics by Varying the Layer and Interfacial Thickness in Novel Carbon-Based Strained-Layer Superlattices
title_fullStr Evaluating Phonon Characteristics by Varying the Layer and Interfacial Thickness in Novel Carbon-Based Strained-Layer Superlattices
title_full_unstemmed Evaluating Phonon Characteristics by Varying the Layer and Interfacial Thickness in Novel Carbon-Based Strained-Layer Superlattices
title_short Evaluating Phonon Characteristics by Varying the Layer and Interfacial Thickness in Novel Carbon-Based Strained-Layer Superlattices
title_sort evaluating phonon characteristics by varying the layer and interfacial thickness in novel carbon based strained layer superlattices
url https://hdl.handle.net/1721.1/153235
work_keys_str_mv AT talwardevkin evaluatingphononcharacteristicsbyvaryingthelayerandinterfacialthicknessinnovelcarbonbasedstrainedlayersuperlattices
AT beclapiotr evaluatingphononcharacteristicsbyvaryingthelayerandinterfacialthicknessinnovelcarbonbasedstrainedlayersuperlattices