Measurement and modeling of small-geometry MOS transistor capacitances
Thesis (Ph.D.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1984.
| Main Author: | |
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| Other Authors: | |
| Format: | Thesis |
| Language: | eng |
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Massachusetts Institute of Technology
2005
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| Online Access: | http://hdl.handle.net/1721.1/15389 |
| _version_ | 1826212716293914624 |
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| author | Paulos, John James |
| author2 | Dimitri A. Antoniadis. |
| author_facet | Dimitri A. Antoniadis. Paulos, John James |
| author_sort | Paulos, John James |
| collection | MIT |
| description | Thesis (Ph.D.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1984. |
| first_indexed | 2024-09-23T15:35:26Z |
| format | Thesis |
| id | mit-1721.1/15389 |
| institution | Massachusetts Institute of Technology |
| language | eng |
| last_indexed | 2024-09-23T15:35:26Z |
| publishDate | 2005 |
| publisher | Massachusetts Institute of Technology |
| record_format | dspace |
| spelling | mit-1721.1/153892019-04-12T09:19:36Z Measurement and modeling of small-geometry MOS transistor capacitances Paulos, John James Dimitri A. Antoniadis. Massachusetts Institute of Technology. Dept. of Electrical Engineering and Computer Science. Massachusetts Institute of Technology. Dept. of Electrical Engineering and Computer Science. Electrical Engineering and Computer Science. Thesis (Ph.D.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1984. MICROFICHE COPY AVAILABLE IN ARCHIVES AND ENGINEERING. Includes bibliographical references. by John James Paulos. Ph.D. 2005-08-05T19:53:56Z 2005-08-05T19:53:56Z 1984 1984 Thesis http://hdl.handle.net/1721.1/15389 12487529 eng M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission. http://dspace.mit.edu/handle/1721.1/7582 306 p. 13266498 bytes 13266254 bytes application/pdf application/pdf application/pdf Massachusetts Institute of Technology |
| spellingShingle | Electrical Engineering and Computer Science. Paulos, John James Measurement and modeling of small-geometry MOS transistor capacitances |
| title | Measurement and modeling of small-geometry MOS transistor capacitances |
| title_full | Measurement and modeling of small-geometry MOS transistor capacitances |
| title_fullStr | Measurement and modeling of small-geometry MOS transistor capacitances |
| title_full_unstemmed | Measurement and modeling of small-geometry MOS transistor capacitances |
| title_short | Measurement and modeling of small-geometry MOS transistor capacitances |
| title_sort | measurement and modeling of small geometry mos transistor capacitances |
| topic | Electrical Engineering and Computer Science. |
| url | http://hdl.handle.net/1721.1/15389 |
| work_keys_str_mv | AT paulosjohnjames measurementandmodelingofsmallgeometrymostransistorcapacitances |