Perspectives on ultra-high vacuum transmission electron microscopy of dynamic crystal growth phenomena
Crystal nucleation and growth is a fundamental pillar of materials design. To advance our understanding of the underlying mechanisms, in situ visual observation plays an important role by providing dynamic information unavailable through conventional postgrowth analysis. Such information includes nu...
| Main Authors: | , , |
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| Format: | Article |
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Elsevier BV
2024
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| Online Access: | https://hdl.handle.net/1721.1/154172 |
| _version_ | 1826216448938213376 |
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| author | Reidy, Kate Thomsen, Joachim Dahl Ross, Frances M. |
| author2 | Massachusetts Institute of Technology. Department of Materials Science and Engineering |
| author_facet | Massachusetts Institute of Technology. Department of Materials Science and Engineering Reidy, Kate Thomsen, Joachim Dahl Ross, Frances M. |
| author_sort | Reidy, Kate |
| collection | MIT |
| description | Crystal nucleation and growth is a fundamental pillar of materials design. To advance our understanding of the underlying mechanisms, in situ visual observation plays an important role by providing dynamic information unavailable through conventional postgrowth analysis. Such information includes nucleation and growth rates,
diffusion phenomena, phase transformation kinetics, strain relaxation mechanisms, and defect formation. Here, we review the contributions of ultra-high vacuum transmission electron microscopy (UHV-TEM) to our = understanding of dynamic crystal growth phenomena. We describe the vacuum, sample handling, and deposition capabilities essential for quantitative studies of reactive metals and semiconductors, and discuss how these capabilities are achieved while preserving the imaging performance of the microscope. We then show examples of growth processes explored using UHV-TEM, where the high spatial and temporal resolution provides unique insights into nanocrystal nucleation, thin film microstructure evolution, and oxidation in controlled
environments. We assess these past accomplishments in the context of recent advances in transmission electron microscopy, discussing how aberration correction, modified sample environments, fast and sensitive detectors, and data science are unlocking powerful opportunities for atomic and temporal resolution measurements using UHV-TEM. We conclude by discussing the challenges and future perspectives for scientific advances using this
technique. |
| first_indexed | 2024-09-23T16:47:52Z |
| format | Article |
| id | mit-1721.1/154172 |
| institution | Massachusetts Institute of Technology |
| last_indexed | 2025-02-19T04:25:58Z |
| publishDate | 2024 |
| publisher | Elsevier BV |
| record_format | dspace |
| spelling | mit-1721.1/1541722025-02-04T02:16:12Z Perspectives on ultra-high vacuum transmission electron microscopy of dynamic crystal growth phenomena Reidy, Kate Thomsen, Joachim Dahl Ross, Frances M. Massachusetts Institute of Technology. Department of Materials Science and Engineering General Materials Science Crystal nucleation and growth is a fundamental pillar of materials design. To advance our understanding of the underlying mechanisms, in situ visual observation plays an important role by providing dynamic information unavailable through conventional postgrowth analysis. Such information includes nucleation and growth rates, diffusion phenomena, phase transformation kinetics, strain relaxation mechanisms, and defect formation. Here, we review the contributions of ultra-high vacuum transmission electron microscopy (UHV-TEM) to our = understanding of dynamic crystal growth phenomena. We describe the vacuum, sample handling, and deposition capabilities essential for quantitative studies of reactive metals and semiconductors, and discuss how these capabilities are achieved while preserving the imaging performance of the microscope. We then show examples of growth processes explored using UHV-TEM, where the high spatial and temporal resolution provides unique insights into nanocrystal nucleation, thin film microstructure evolution, and oxidation in controlled environments. We assess these past accomplishments in the context of recent advances in transmission electron microscopy, discussing how aberration correction, modified sample environments, fast and sensitive detectors, and data science are unlocking powerful opportunities for atomic and temporal resolution measurements using UHV-TEM. We conclude by discussing the challenges and future perspectives for scientific advances using this technique. MIT Energy Initiative, Independent Research Fund Denmark 2024-04-17T19:01:17Z 2024-04-17T19:01:17Z 2023-10 Article http://purl.org/eprint/type/JournalArticle 0079-6425 https://hdl.handle.net/1721.1/154172 Reidy, Kate, Thomsen, Joachim Dahl and Ross, Frances M. 2023. "Perspectives on ultra-high vacuum transmission electron microscopy of dynamic crystal growth phenomena." Progress in Materials Science, 139. 10.1016/j.pmatsci.2023.101163 Progress in Materials Science Creative Commons Attribution-Noncommercial-ShareAlike http://creativecommons.org/licenses/by-nc-sa/4.0/ application/pdf Elsevier BV Author |
| spellingShingle | General Materials Science Reidy, Kate Thomsen, Joachim Dahl Ross, Frances M. Perspectives on ultra-high vacuum transmission electron microscopy of dynamic crystal growth phenomena |
| title | Perspectives on ultra-high vacuum transmission electron microscopy of dynamic crystal growth phenomena |
| title_full | Perspectives on ultra-high vacuum transmission electron microscopy of dynamic crystal growth phenomena |
| title_fullStr | Perspectives on ultra-high vacuum transmission electron microscopy of dynamic crystal growth phenomena |
| title_full_unstemmed | Perspectives on ultra-high vacuum transmission electron microscopy of dynamic crystal growth phenomena |
| title_short | Perspectives on ultra-high vacuum transmission electron microscopy of dynamic crystal growth phenomena |
| title_sort | perspectives on ultra high vacuum transmission electron microscopy of dynamic crystal growth phenomena |
| topic | General Materials Science |
| url | https://hdl.handle.net/1721.1/154172 |
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