| _version_ |
1811081333756133376
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| author |
Rogers, Alan E.E.
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| author_facet |
Rogers, Alan E.E.
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| author_sort |
Rogers, Alan E.E.
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| collection |
MIT
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| first_indexed |
2024-09-23T11:45:07Z
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| id |
mit-1721.1/154630
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| institution |
Massachusetts Institute of Technology
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| last_indexed |
2024-09-23T11:45:07Z
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| publishDate |
2024
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| record_format |
dspace
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| spelling |
mit-1721.1/1546302024-05-04T03:40:41Z Tests of LNA input S11 and switch contact resistance. Rogers, Alan E.E. 2024-05-03T17:59:54Z 2024-05-03T17:59:54Z 2017-03-13 https://hdl.handle.net/1721.1/154630 EDGES MEMO #238 application/pdf
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| spellingShingle |
Rogers, Alan E.E.
Tests of LNA input S11 and switch contact resistance.
|
| title |
Tests of LNA input S11 and switch contact resistance.
|
| title_full |
Tests of LNA input S11 and switch contact resistance.
|
| title_fullStr |
Tests of LNA input S11 and switch contact resistance.
|
| title_full_unstemmed |
Tests of LNA input S11 and switch contact resistance.
|
| title_short |
Tests of LNA input S11 and switch contact resistance.
|
| title_sort |
tests of lna input s11 and switch contact resistance
|
| url |
https://hdl.handle.net/1721.1/154630
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| work_keys_str_mv |
AT rogersalanee testsoflnainputs11andswitchcontactresistance
|