Toward Simulation-Free Estimation of Critical Clearing Time

Contingency screening for transient stability of large-scale, strongly nonlinear, interconnected power systems is one of the most computationally challenging parts of Dynamic Security Assessment and requires huge resources to perform time-domain simulations-based assessment. To reduce computational...

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Bibliographic Details
Main Authors: Vu, Thanh Long, Al Araifi, Surour M., El Moursi, Mohamed S., Turitsyn, Konstantin
Other Authors: Massachusetts Institute of Technology. Department of Mechanical Engineering
Format: Article
Language:English
Published: Institute of Electrical and Electronics Engineers 2024
Online Access:https://hdl.handle.net/1721.1/155144
Description
Summary:Contingency screening for transient stability of large-scale, strongly nonlinear, interconnected power systems is one of the most computationally challenging parts of Dynamic Security Assessment and requires huge resources to perform time-domain simulations-based assessment. To reduce computational cost of time-domain simulations, direct energy methods have been extensively developed. However, these methods, as well as other existing methods, still rely on time-consuming numerical integration of the fault-on dynamics. This task is computationally hard, since possibly thousands of contingencies need to be scanned and thousands of accompanied fault-on dynamics simulations need to be performed and stored on a regular basis. In this paper, we introduce a novel framework to eliminate the need for fault-on dynamics simulations in contingency screening. This simulation-free framework is based on bounding the fault-on dynamics and extending the recently introduced Lyapunov Function Family approach for transient stability analysis of structure-preserving model. In turn, a lower bound of the critical clearing time is obtained by solving convex optimization problems without relying on any time-domain simulations. A comprehensive analysis is carried out to validate this novel technique on a number of IEEE test cases.