Hazard, T., Woods, W., Rosenberg, D., Das, R., Hirjibehedin, C., Kim, D., . . . Laboratory, L. (2024). Characterization of superconducting through-silicon vias as capacitive elements in quantum circuits. AIP Publishing.
Citazione stile Chigago Style (17a edizione)Hazard, TM, et al. Characterization of Superconducting Through-silicon Vias as Capacitive Elements in Quantum Circuits. AIP Publishing, 2024.
Citatione MLA (9a ed.)Hazard, TM, et al. Characterization of Superconducting Through-silicon Vias as Capacitive Elements in Quantum Circuits. AIP Publishing, 2024.
Attenzione: Queste citazioni potrebbero non essere precise al 100%.