Hazard, T., Woods, W., Rosenberg, D., Das, R., Hirjibehedin, C., Kim, D., . . . Laboratory, L. (2024). Characterization of superconducting through-silicon vias as capacitive elements in quantum circuits. AIP Publishing.
Цитирование в стиле Чикаго (17-е изд.)Hazard, TM, et al. Characterization of Superconducting Through-silicon Vias as Capacitive Elements in Quantum Circuits. AIP Publishing, 2024.
Цитирование MLA (9-е изд.)Hazard, TM, et al. Characterization of Superconducting Through-silicon Vias as Capacitive Elements in Quantum Circuits. AIP Publishing, 2024.
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