Hazard, T., Woods, W., Rosenberg, D., Das, R., Hirjibehedin, C., Kim, D., . . . Laboratory, L. (2024). Characterization of superconducting through-silicon vias as capacitive elements in quantum circuits. AIP Publishing.
Dyfyniad Arddull ChicagoHazard, TM, et al. Characterization of Superconducting Through-silicon Vias as Capacitive Elements in Quantum Circuits. AIP Publishing, 2024.
Dyfyniad MLAHazard, TM, et al. Characterization of Superconducting Through-silicon Vias as Capacitive Elements in Quantum Circuits. AIP Publishing, 2024.
Rhybudd: Mae'n bosib nad yw'r dyfyniadau hyn bob amser yn 100% cywir.