Hazard, T., Woods, W., Rosenberg, D., Das, R., Hirjibehedin, C., Kim, D., . . . Laboratory, L. (2024). Characterization of superconducting through-silicon vias as capacitive elements in quantum circuits. AIP Publishing.
Chicago Style (17th ed.) CitationHazard, TM, et al. Characterization of Superconducting Through-silicon Vias as Capacitive Elements in Quantum Circuits. AIP Publishing, 2024.
MLA引文Hazard, TM, et al. Characterization of Superconducting Through-silicon Vias as Capacitive Elements in Quantum Circuits. AIP Publishing, 2024.
警告:這些引文格式不一定是100%准確.