High-reliability architectures for networks under stress
Thesis (S.M.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 2003.
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| Format: | Thesis |
| Language: | eng |
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Massachusetts Institute of Technology
2005
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| Online Access: | http://hdl.handle.net/1721.1/16943 |
| _version_ | 1826199268668473344 |
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| author | Weichenberg, Guy E. (Guy Elli), 1978- |
| author2 | Vincent W.S. Chan and Muriel Médard. |
| author_facet | Vincent W.S. Chan and Muriel Médard. Weichenberg, Guy E. (Guy Elli), 1978- |
| author_sort | Weichenberg, Guy E. (Guy Elli), 1978- |
| collection | MIT |
| description | Thesis (S.M.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 2003. |
| first_indexed | 2024-09-23T11:17:04Z |
| format | Thesis |
| id | mit-1721.1/16943 |
| institution | Massachusetts Institute of Technology |
| language | eng |
| last_indexed | 2024-09-23T11:17:04Z |
| publishDate | 2005 |
| publisher | Massachusetts Institute of Technology |
| record_format | dspace |
| spelling | mit-1721.1/169432019-04-12T07:20:05Z High-reliability architectures for networks under stress Weichenberg, Guy E. (Guy Elli), 1978- Vincent W.S. Chan and Muriel Médard. Massachusetts Institute of Technology. Dept. of Electrical Engineering and Computer Science. Massachusetts Institute of Technology. Dept. of Electrical Engineering and Computer Science. Electrical Engineering and Computer Science. Thesis (S.M.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 2003. Includes bibliographical references (p. 157-165). This electronic version was submitted by the student author. The certified thesis is available in the Institute Archives and Special Collections. In this thesis, we develop a methodology for architecting high-reliability communication networks. Previous results in the network reliability field are mostly theoretical in nature with little immediate applicability to the design of real networks. We bring together these contributions and develop new results and insights which are of value in designing networks that meet prescribed levels of reliability. Furthermore, most existing results assume that component failures are statistically independent in nature. We take initial steps in developing a methodology for the design of networks with statistically dependent link failures. We also study the architectures of networks under extreme stress. by Guy E. Weichenberg. S.M. 2005-05-19T15:22:41Z 2005-05-19T15:22:41Z 2003 2003 Thesis http://hdl.handle.net/1721.1/16943 53245942 eng M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission. http://dspace.mit.edu/handle/1721.1/7582 165 p. 900761 bytes 900510 bytes application/pdf application/pdf application/pdf Massachusetts Institute of Technology |
| spellingShingle | Electrical Engineering and Computer Science. Weichenberg, Guy E. (Guy Elli), 1978- High-reliability architectures for networks under stress |
| title | High-reliability architectures for networks under stress |
| title_full | High-reliability architectures for networks under stress |
| title_fullStr | High-reliability architectures for networks under stress |
| title_full_unstemmed | High-reliability architectures for networks under stress |
| title_short | High-reliability architectures for networks under stress |
| title_sort | high reliability architectures for networks under stress |
| topic | Electrical Engineering and Computer Science. |
| url | http://hdl.handle.net/1721.1/16943 |
| work_keys_str_mv | AT weichenbergguyeguyelli1978 highreliabilityarchitecturesfornetworksunderstress |