High-reliability architectures for networks under stress

High-reliability architectures for networks under stress

Thesis (S.M.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 2003.

Bibliographic Details
Main Author:	Weichenberg, Guy E. (Guy Elli), 1978-
Other Authors:	Vincent W.S. Chan and Muriel Médard.
Format:	Thesis
Language:	eng
Published:	Massachusetts Institute of Technology 2005
Subjects:	Electrical Engineering and Computer Science.
Online Access:	http://hdl.handle.net/1721.1/16943

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