Matching Japan in quality : how the leading U.S. semiconductor firms caught up with the best in Japan
Includes bibliographical references.
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Language: | eng |
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MIT Japan Program, Massachusetts Institute of Technology
2005
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Online Access: | http://hdl.handle.net/1721.1/17109 |
_version_ | 1811068604266840064 |
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author2 | MIT Japan Program. |
author_facet | MIT Japan Program. |
collection | MIT |
description | Includes bibliographical references. |
first_indexed | 2024-09-23T07:58:24Z |
id | mit-1721.1/17109 |
institution | Massachusetts Institute of Technology |
language | eng |
last_indexed | 2024-09-23T07:58:24Z |
publishDate | 2005 |
publisher | MIT Japan Program, Massachusetts Institute of Technology |
record_format | dspace |
spelling | mit-1721.1/171092019-04-09T15:52:03Z Matching Japan in quality : how the leading U.S. semiconductor firms caught up with the best in Japan MIT Japan Program. Finan, William F Q180.J3 M22 no.93-01 Includes bibliographical references. William F. Finan. 2005-06-01T15:20:05Z 2005-06-01T15:20:05Z 1993 93-01 http://hdl.handle.net/1721.1/17109 eng MITJP (Series) ; 93-01. 31 p. 2480874 bytes application/pdf application/pdf MIT Japan Program, Massachusetts Institute of Technology |
spellingShingle | Q180.J3 M22 no.93-01 Matching Japan in quality : how the leading U.S. semiconductor firms caught up with the best in Japan |
title | Matching Japan in quality : how the leading U.S. semiconductor firms caught up with the best in Japan |
title_full | Matching Japan in quality : how the leading U.S. semiconductor firms caught up with the best in Japan |
title_fullStr | Matching Japan in quality : how the leading U.S. semiconductor firms caught up with the best in Japan |
title_full_unstemmed | Matching Japan in quality : how the leading U.S. semiconductor firms caught up with the best in Japan |
title_short | Matching Japan in quality : how the leading U.S. semiconductor firms caught up with the best in Japan |
title_sort | matching japan in quality how the leading u s semiconductor firms caught up with the best in japan |
topic | Q180.J3 M22 no.93-01 |
url | http://hdl.handle.net/1721.1/17109 |