Matching Japan in quality : how the leading U.S. semiconductor firms caught up with the best in Japan

Includes bibliographical references.

Bibliographic Details
Other Authors: MIT Japan Program.
Language:eng
Published: MIT Japan Program, Massachusetts Institute of Technology 2005
Subjects:
Online Access:http://hdl.handle.net/1721.1/17109
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author2 MIT Japan Program.
author_facet MIT Japan Program.
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description Includes bibliographical references.
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institution Massachusetts Institute of Technology
language eng
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spelling mit-1721.1/171092019-04-09T15:52:03Z Matching Japan in quality : how the leading U.S. semiconductor firms caught up with the best in Japan MIT Japan Program. Finan, William F Q180.J3 M22 no.93-01 Includes bibliographical references. William F. Finan. 2005-06-01T15:20:05Z 2005-06-01T15:20:05Z 1993 93-01 http://hdl.handle.net/1721.1/17109 eng MITJP (Series) ; 93-01. 31 p. 2480874 bytes application/pdf application/pdf MIT Japan Program, Massachusetts Institute of Technology
spellingShingle Q180.J3 M22 no.93-01
Matching Japan in quality : how the leading U.S. semiconductor firms caught up with the best in Japan
title Matching Japan in quality : how the leading U.S. semiconductor firms caught up with the best in Japan
title_full Matching Japan in quality : how the leading U.S. semiconductor firms caught up with the best in Japan
title_fullStr Matching Japan in quality : how the leading U.S. semiconductor firms caught up with the best in Japan
title_full_unstemmed Matching Japan in quality : how the leading U.S. semiconductor firms caught up with the best in Japan
title_short Matching Japan in quality : how the leading U.S. semiconductor firms caught up with the best in Japan
title_sort matching japan in quality how the leading u s semiconductor firms caught up with the best in japan
topic Q180.J3 M22 no.93-01
url http://hdl.handle.net/1721.1/17109