Alignment and characterization of carbon nanotubes of photolithographically patterned electrodes

Thesis (M. Eng.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 2004.

Bibliographic Details
Main Author: Son, HyungBin, 1981-
Other Authors: Mildred S. Dresselhaus.
Format: Thesis
Language:eng
Published: Massachusetts Institute of Technology 2005
Subjects:
Online Access:http://hdl.handle.net/1721.1/17989
_version_ 1826202314860396544
author Son, HyungBin, 1981-
author2 Mildred S. Dresselhaus.
author_facet Mildred S. Dresselhaus.
Son, HyungBin, 1981-
author_sort Son, HyungBin, 1981-
collection MIT
description Thesis (M. Eng.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 2004.
first_indexed 2024-09-23T12:05:34Z
format Thesis
id mit-1721.1/17989
institution Massachusetts Institute of Technology
language eng
last_indexed 2024-09-23T12:05:34Z
publishDate 2005
publisher Massachusetts Institute of Technology
record_format dspace
spelling mit-1721.1/179892019-04-11T13:28:36Z Alignment and characterization of carbon nanotubes of photolithographically patterned electrodes Son, HyungBin, 1981- Mildred S. Dresselhaus. Massachusetts Institute of Technology. Dept. of Electrical Engineering and Computer Science. Massachusetts Institute of Technology. Dept. of Electrical Engineering and Computer Science. Electrical Engineering and Computer Science. Thesis (M. Eng.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 2004. Includes bibliographical references (p. 45-48). The goal of this work is to make an (n,m) assignment for individual suspended single wall carbon nanotubes (SWNTs) based on the measurements of their Raman Radial Breathing Modes and electron transition energies E[sub]ii based on Raman spectroscopy. The suspended SWNTs are grown on a photolithographically defined electrode pattern, which is designed so that suspended SWNTs are grown at known locations with known directions. The suspended SWNTs are then characterized by atomic force microscopy (AFM), scanning electron microscopy (SEM), and Raman spectroscopy. Finally, the information on the diameter distribution and the energy of the electronic transitions of the resonant suspended SWNTs obtained from Raman spectroscopy is compared to other published works to make (n,m) assignments of a number of suspended SWNTs. by Hyungbin Son. M.Eng. 2005-06-02T19:31:47Z 2005-06-02T19:31:47Z 2004 2004 Thesis http://hdl.handle.net/1721.1/17989 57192671 eng M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission. http://dspace.mit.edu/handle/1721.1/7582 48 p. 2268908 bytes 2272609 bytes application/pdf application/pdf application/pdf Massachusetts Institute of Technology
spellingShingle Electrical Engineering and Computer Science.
Son, HyungBin, 1981-
Alignment and characterization of carbon nanotubes of photolithographically patterned electrodes
title Alignment and characterization of carbon nanotubes of photolithographically patterned electrodes
title_full Alignment and characterization of carbon nanotubes of photolithographically patterned electrodes
title_fullStr Alignment and characterization of carbon nanotubes of photolithographically patterned electrodes
title_full_unstemmed Alignment and characterization of carbon nanotubes of photolithographically patterned electrodes
title_short Alignment and characterization of carbon nanotubes of photolithographically patterned electrodes
title_sort alignment and characterization of carbon nanotubes of photolithographically patterned electrodes
topic Electrical Engineering and Computer Science.
url http://hdl.handle.net/1721.1/17989
work_keys_str_mv AT sonhyungbin1981 alignmentandcharacterizationofcarbonnanotubesofphotolithographicallypatternedelectrodes