Design tool and methodologies for interconnect reliability analysis in integrated circuits
Thesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 2004.
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Format: | Thesis |
Language: | en_US |
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Massachusetts Institute of Technology
2005
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Online Access: | http://hdl.handle.net/1721.1/26722 |
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author | Alam, Syed Mohiul, 1975- |
author2 | Donald E. Troxel and Carl V. Thompson. |
author_facet | Donald E. Troxel and Carl V. Thompson. Alam, Syed Mohiul, 1975- |
author_sort | Alam, Syed Mohiul, 1975- |
collection | MIT |
description | Thesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 2004. |
first_indexed | 2024-09-23T12:33:12Z |
format | Thesis |
id | mit-1721.1/26722 |
institution | Massachusetts Institute of Technology |
language | en_US |
last_indexed | 2024-09-23T12:33:12Z |
publishDate | 2005 |
publisher | Massachusetts Institute of Technology |
record_format | dspace |
spelling | mit-1721.1/267222019-04-12T09:12:35Z Design tool and methodologies for interconnect reliability analysis in integrated circuits Alam, Syed Mohiul, 1975- Donald E. Troxel and Carl V. Thompson. Massachusetts Institute of Technology. Dept. of Electrical Engineering and Computer Science. Massachusetts Institute of Technology. Dept. of Electrical Engineering and Computer Science. Electrical Engineering and Computer Science. Thesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 2004. This electronic version was submitted by the student author. The certified thesis is available in the Institute Archives and Special Collections. Includes bibliographical references (p. 195-204). by Syed Mohiul Alam. Ph.D. 2005-09-06T19:49:12Z 2005-09-06T19:49:12Z 2004 2004 Thesis http://hdl.handle.net/1721.1/26722 59553725 en_US M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission. http://dspace.mit.edu/handle/1721.1/7582 204 p. 3195793 bytes 3262614 bytes application/pdf application/pdf application/pdf Massachusetts Institute of Technology |
spellingShingle | Electrical Engineering and Computer Science. Alam, Syed Mohiul, 1975- Design tool and methodologies for interconnect reliability analysis in integrated circuits |
title | Design tool and methodologies for interconnect reliability analysis in integrated circuits |
title_full | Design tool and methodologies for interconnect reliability analysis in integrated circuits |
title_fullStr | Design tool and methodologies for interconnect reliability analysis in integrated circuits |
title_full_unstemmed | Design tool and methodologies for interconnect reliability analysis in integrated circuits |
title_short | Design tool and methodologies for interconnect reliability analysis in integrated circuits |
title_sort | design tool and methodologies for interconnect reliability analysis in integrated circuits |
topic | Electrical Engineering and Computer Science. |
url | http://hdl.handle.net/1721.1/26722 |
work_keys_str_mv | AT alamsyedmohiul1975 designtoolandmethodologiesforinterconnectreliabilityanalysisinintegratedcircuits |