Design tool and methodologies for interconnect reliability analysis in integrated circuits

Thesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 2004.

Bibliographic Details
Main Author: Alam, Syed Mohiul, 1975-
Other Authors: Donald E. Troxel and Carl V. Thompson.
Format: Thesis
Language:en_US
Published: Massachusetts Institute of Technology 2005
Subjects:
Online Access:http://hdl.handle.net/1721.1/26722
_version_ 1811083446983852032
author Alam, Syed Mohiul, 1975-
author2 Donald E. Troxel and Carl V. Thompson.
author_facet Donald E. Troxel and Carl V. Thompson.
Alam, Syed Mohiul, 1975-
author_sort Alam, Syed Mohiul, 1975-
collection MIT
description Thesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 2004.
first_indexed 2024-09-23T12:33:12Z
format Thesis
id mit-1721.1/26722
institution Massachusetts Institute of Technology
language en_US
last_indexed 2024-09-23T12:33:12Z
publishDate 2005
publisher Massachusetts Institute of Technology
record_format dspace
spelling mit-1721.1/267222019-04-12T09:12:35Z Design tool and methodologies for interconnect reliability analysis in integrated circuits Alam, Syed Mohiul, 1975- Donald E. Troxel and Carl V. Thompson. Massachusetts Institute of Technology. Dept. of Electrical Engineering and Computer Science. Massachusetts Institute of Technology. Dept. of Electrical Engineering and Computer Science. Electrical Engineering and Computer Science. Thesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 2004. This electronic version was submitted by the student author. The certified thesis is available in the Institute Archives and Special Collections. Includes bibliographical references (p. 195-204). by Syed Mohiul Alam. Ph.D. 2005-09-06T19:49:12Z 2005-09-06T19:49:12Z 2004 2004 Thesis http://hdl.handle.net/1721.1/26722 59553725 en_US M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission. http://dspace.mit.edu/handle/1721.1/7582 204 p. 3195793 bytes 3262614 bytes application/pdf application/pdf application/pdf Massachusetts Institute of Technology
spellingShingle Electrical Engineering and Computer Science.
Alam, Syed Mohiul, 1975-
Design tool and methodologies for interconnect reliability analysis in integrated circuits
title Design tool and methodologies for interconnect reliability analysis in integrated circuits
title_full Design tool and methodologies for interconnect reliability analysis in integrated circuits
title_fullStr Design tool and methodologies for interconnect reliability analysis in integrated circuits
title_full_unstemmed Design tool and methodologies for interconnect reliability analysis in integrated circuits
title_short Design tool and methodologies for interconnect reliability analysis in integrated circuits
title_sort design tool and methodologies for interconnect reliability analysis in integrated circuits
topic Electrical Engineering and Computer Science.
url http://hdl.handle.net/1721.1/26722
work_keys_str_mv AT alamsyedmohiul1975 designtoolandmethodologiesforinterconnectreliabilityanalysisinintegratedcircuits