Metrics : you are what you measure!
Title from cover. "January, 1998."
Other Authors: | |
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Language: | eng |
Published: |
Sloan School of Management, Massachusetts Institute of Technology
2003
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Online Access: | http://hdl.handle.net/1721.1/2703 |
_version_ | 1826202135051632640 |
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author2 | Hauser, John R. |
author_facet | Hauser, John R. |
collection | MIT |
description | Title from cover. "January, 1998." |
first_indexed | 2024-09-23T12:02:24Z |
id | mit-1721.1/2703 |
institution | Massachusetts Institute of Technology |
language | eng |
last_indexed | 2024-09-23T12:02:24Z |
publishDate | 2003 |
publisher | Sloan School of Management, Massachusetts Institute of Technology |
record_format | dspace |
spelling | mit-1721.1/27032019-04-11T07:03:29Z Metrics : you are what you measure! Hauser, John R. Katz, Gerald M. Sloan School of Management. International Center for Research on the Management of Technology. HD28 .M414 no.4009-98 Title from cover. "January, 1998." Includes bibliographical references (p. 26-27). John R. Hauser, Gerald M. Katz. 2003-04-29T05:16:08Z 2003-04-29T05:16:08Z 1998 1998 #4009 http://hdl.handle.net/1721.1/2703 eng WP (International Center for Research on the Management of Technology) ; 172-98 Working paper (Sloan School of Management) ; WP 4009-98. 27 p. 2201647 bytes application/pdf application/pdf Sloan School of Management, Massachusetts Institute of Technology |
spellingShingle | HD28 .M414 no.4009-98 Metrics : you are what you measure! |
title | Metrics : you are what you measure! |
title_full | Metrics : you are what you measure! |
title_fullStr | Metrics : you are what you measure! |
title_full_unstemmed | Metrics : you are what you measure! |
title_short | Metrics : you are what you measure! |
title_sort | metrics you are what you measure |
topic | HD28 .M414 no.4009-98 |
url | http://hdl.handle.net/1721.1/2703 |