Hot-carrier reliability of MOSFETs at room and cryogenic temperature
Thesis (Ph.D.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1999.
| Main Author: | |
|---|---|
| Other Authors: | |
| Format: | Thesis |
| Language: | en_US |
| Published: |
Massachusetts Institute of Technology
2005
|
| Subjects: | |
| Online Access: | http://hdl.handle.net/1721.1/28215 |