Measuring atomic properties with an atom interferometer
Thesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Physics, 2002.
Autor principal: | Roberts, Tony David, 1972- |
---|---|
Outros Autores: | David E. Pritchard. |
Formato: | Thesis |
Idioma: | eng |
Publicado em: |
Massachusetts Institute of Technology
2005
|
Assuntos: | |
Acesso em linha: | http://hdl.handle.net/1721.1/29302 |
Registos relacionados
-
Measuring Atomic Properties with an Atom Interferometer
Por: Roberts, Tony David
Publicado em: (2006) -
Measuring decoherence and the matter-wave index of refraction with an improved atom interferometer
Por: Kokorowski, David Anthony, 1973-
Publicado em: (2005) -
Towards a guided atom interferometer based on a superconducting atom chip
Por: Müller, T., et al.
Publicado em: (2014) -
Experiments with a separated beam atom interferometer
Por: Ekstrom, Christopher Russell
Publicado em: (2005) -
High-Resolution Atom Interferometers with Suppressed Diffraction Phases
Por: Estey, Brian, et al.
Publicado em: (2015)