Effects of Applied Loads, Effective Contact Area and Surface Roughness on the Dicing Yield of 3D Cu Bonded Interconnects
Bonded copper interconnects were created using thermo-compression bonding and the dicing yield was used as an indication of the bond quality. SEM images indicated that the Cu was plastically deformed. Our experimental and modeling results indicate that the effective contact area is directly proporti...
| Main Authors: | , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
2005
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| Online Access: | http://hdl.handle.net/1721.1/29818 |
| _version_ | 1826211322254065664 |
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| author | Leong, Hoi Liong Gan, C.L. Pey, Kin Leong Thompson, Carl V. Li, Hongyu |
| author_facet | Leong, Hoi Liong Gan, C.L. Pey, Kin Leong Thompson, Carl V. Li, Hongyu |
| author_sort | Leong, Hoi Liong |
| collection | MIT |
| description | Bonded copper interconnects were created using thermo-compression bonding and the dicing yield was used as an indication of the bond quality. SEM images indicated that the Cu was plastically deformed. Our experimental and modeling results indicate that the effective contact area is directly proportional to the applied load. Furthermore, for first time, results have been obtained that indicate that the dicing yield is proportional to the measured bond strength, and the bond strength is proportional to the effective contact area. It is also shown that films with rougher surfaces (and corresponding lower effective bonding areas) have lower bond strengths and dicing yields. A quantitative model for the relationship between measured surface roughness and the corresponding dicing yield has been developed. An appropriate surface-roughness data acquisition methodology has also been developed. The maximum possible applied load and the minimum possible surface roughness are required to obtain the maximum effective contact area, and hence to achieve optimum yields (both mechanically and electrically). |
| first_indexed | 2024-09-23T15:04:05Z |
| format | Article |
| id | mit-1721.1/29818 |
| institution | Massachusetts Institute of Technology |
| language | English |
| last_indexed | 2024-09-23T15:04:05Z |
| publishDate | 2005 |
| record_format | dspace |
| spelling | mit-1721.1/298182019-04-12T08:25:34Z Effects of Applied Loads, Effective Contact Area and Surface Roughness on the Dicing Yield of 3D Cu Bonded Interconnects Leong, Hoi Liong Gan, C.L. Pey, Kin Leong Thompson, Carl V. Li, Hongyu Cu-Cu thermo-compression bonding wafer-wafer bonding Bonded copper interconnects were created using thermo-compression bonding and the dicing yield was used as an indication of the bond quality. SEM images indicated that the Cu was plastically deformed. Our experimental and modeling results indicate that the effective contact area is directly proportional to the applied load. Furthermore, for first time, results have been obtained that indicate that the dicing yield is proportional to the measured bond strength, and the bond strength is proportional to the effective contact area. It is also shown that films with rougher surfaces (and corresponding lower effective bonding areas) have lower bond strengths and dicing yields. A quantitative model for the relationship between measured surface roughness and the corresponding dicing yield has been developed. An appropriate surface-roughness data acquisition methodology has also been developed. The maximum possible applied load and the minimum possible surface roughness are required to obtain the maximum effective contact area, and hence to achieve optimum yields (both mechanically and electrically). Singapore-MIT Alliance (SMA) 2005-12-12T16:15:35Z 2005-12-12T16:15:35Z 2006-01 Article http://hdl.handle.net/1721.1/29818 en Advanced Materials for Micro- and Nano-Systems (AMMNS) 412699 bytes application/pdf application/pdf |
| spellingShingle | Cu-Cu thermo-compression bonding wafer-wafer bonding Leong, Hoi Liong Gan, C.L. Pey, Kin Leong Thompson, Carl V. Li, Hongyu Effects of Applied Loads, Effective Contact Area and Surface Roughness on the Dicing Yield of 3D Cu Bonded Interconnects |
| title | Effects of Applied Loads, Effective Contact Area and Surface Roughness on the Dicing Yield of 3D Cu Bonded Interconnects |
| title_full | Effects of Applied Loads, Effective Contact Area and Surface Roughness on the Dicing Yield of 3D Cu Bonded Interconnects |
| title_fullStr | Effects of Applied Loads, Effective Contact Area and Surface Roughness on the Dicing Yield of 3D Cu Bonded Interconnects |
| title_full_unstemmed | Effects of Applied Loads, Effective Contact Area and Surface Roughness on the Dicing Yield of 3D Cu Bonded Interconnects |
| title_short | Effects of Applied Loads, Effective Contact Area and Surface Roughness on the Dicing Yield of 3D Cu Bonded Interconnects |
| title_sort | effects of applied loads effective contact area and surface roughness on the dicing yield of 3d cu bonded interconnects |
| topic | Cu-Cu thermo-compression bonding wafer-wafer bonding |
| url | http://hdl.handle.net/1721.1/29818 |
| work_keys_str_mv | AT leonghoiliong effectsofappliedloadseffectivecontactareaandsurfaceroughnessonthedicingyieldof3dcubondedinterconnects AT gancl effectsofappliedloadseffectivecontactareaandsurfaceroughnessonthedicingyieldof3dcubondedinterconnects AT peykinleong effectsofappliedloadseffectivecontactareaandsurfaceroughnessonthedicingyieldof3dcubondedinterconnects AT thompsoncarlv effectsofappliedloadseffectivecontactareaandsurfaceroughnessonthedicingyieldof3dcubondedinterconnects AT lihongyu effectsofappliedloadseffectivecontactareaandsurfaceroughnessonthedicingyieldof3dcubondedinterconnects |