Continuum models for intergranular films in silicon nitride and comparison to atomistic simulations

Continuum models for intergranular films in silicon nitride and comparison to atomistic simulations

Thesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Materials Science and Engineering, 2003.

Bibliographic Details
Main Author: Bishop, Catherine M. (Catherine Mary), 1975-
Other Authors: W. Craig Carter.
Format: Thesis
Language:eng
Published: Massachusetts Institute of Technology 2006
Subjects:
Materials Science and Engineering.
Online Access:http://hdl.handle.net/1721.1/29968
Description
Summary:Thesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Materials Science and Engineering, 2003.

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