Eclat: Automatic Generation and Classification of Test Inputs
This paper describes a technique that helps a test engineerselect, from a large set of randomly generated testinputs, a small subset likely to reveal faults in the softwareunder test. The technique takes a program or software component,plus a set of normal executionsÂsay, from an existingtest suite...
| Main Authors: | , |
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| Other Authors: | |
| Language: | en_US |
| Published: |
2005
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| Online Access: | http://hdl.handle.net/1721.1/30414 |
| _version_ | 1826209677346603008 |
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| author | Pacheo, Carlos Ernst, Michael D. |
| author2 | Program Analysis |
| author_facet | Program Analysis Pacheo, Carlos Ernst, Michael D. |
| author_sort | Pacheo, Carlos |
| collection | MIT |
| description | This paper describes a technique that helps a test engineerselect, from a large set of randomly generated testinputs, a small subset likely to reveal faults in the softwareunder test. The technique takes a program or software component,plus a set of normal executionsÂsay, from an existingtest suite, or from observations of the software runningproperly. The technique works by extracting an operationalmodel of the softwareÂs operation, and comparingeach inputÂs operational pattern of execution against themodel. Test inputs whose operational pattern is suggestiveof a fault are further reduced by selecting only one inputper such pattern. The result is a small portion of the originalinputs, deemed most likely to reveal faults. Thus, ourtechnique can also be seen as an error-detection technique.We have implemented these ideas in the Eclat tool, designedfor unit testing of Java classes. Eclat generates alarge number of inputs and uses our technique to select onlya few of them as fault-revealing. The inputs that it selectsare an order of magnitude more likely to reveal faults thannon-selected inputs. |
| first_indexed | 2024-09-23T14:26:51Z |
| id | mit-1721.1/30414 |
| institution | Massachusetts Institute of Technology |
| language | en_US |
| last_indexed | 2024-09-23T14:26:51Z |
| publishDate | 2005 |
| record_format | dspace |
| spelling | mit-1721.1/304142019-04-12T08:26:03Z Eclat: Automatic Generation and Classification of Test Inputs Pacheo, Carlos Ernst, Michael D. Program Analysis This paper describes a technique that helps a test engineerselect, from a large set of randomly generated testinputs, a small subset likely to reveal faults in the softwareunder test. The technique takes a program or software component,plus a set of normal executionsÂsay, from an existingtest suite, or from observations of the software runningproperly. The technique works by extracting an operationalmodel of the softwareÂs operation, and comparingeach inputÂs operational pattern of execution against themodel. Test inputs whose operational pattern is suggestiveof a fault are further reduced by selecting only one inputper such pattern. The result is a small portion of the originalinputs, deemed most likely to reveal faults. Thus, ourtechnique can also be seen as an error-detection technique.We have implemented these ideas in the Eclat tool, designedfor unit testing of Java classes. Eclat generates alarge number of inputs and uses our technique to select onlya few of them as fault-revealing. The inputs that it selectsare an order of magnitude more likely to reveal faults thannon-selected inputs. 2005-12-19T23:26:54Z 2005-12-19T23:26:54Z 2004-10-14 MIT-CSAIL-TR-2004-063 MIT-LCS-TR-968 http://hdl.handle.net/1721.1/30414 en_US Massachusetts Institute of Technology Computer Science and Artificial Intelligence Laboratory 10 p. 16601827 bytes 677668 bytes application/postscript application/pdf application/postscript application/pdf |
| spellingShingle | Pacheo, Carlos Ernst, Michael D. Eclat: Automatic Generation and Classification of Test Inputs |
| title | Eclat: Automatic Generation and Classification of Test Inputs |
| title_full | Eclat: Automatic Generation and Classification of Test Inputs |
| title_fullStr | Eclat: Automatic Generation and Classification of Test Inputs |
| title_full_unstemmed | Eclat: Automatic Generation and Classification of Test Inputs |
| title_short | Eclat: Automatic Generation and Classification of Test Inputs |
| title_sort | eclat automatic generation and classification of test inputs |
| url | http://hdl.handle.net/1721.1/30414 |
| work_keys_str_mv | AT pacheocarlos eclatautomaticgenerationandclassificationoftestinputs AT ernstmichaeld eclatautomaticgenerationandclassificationoftestinputs |