Misfit accomodation in thin films of Ni/Cu as measured by magnetic anisotropy
Thesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Materials Science and Engineering, 1995.
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| Format: | Thesis |
| Language: | eng |
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Massachusetts Institute of Technology
2006
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| Online Access: | http://hdl.handle.net/1721.1/32659 |
| _version_ | 1811083187391037440 |
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| author | Inglefield, Heather Elizabeth |
| author2 | Carl V. Thompson. |
| author_facet | Carl V. Thompson. Inglefield, Heather Elizabeth |
| author_sort | Inglefield, Heather Elizabeth |
| collection | MIT |
| description | Thesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Materials Science and Engineering, 1995. |
| first_indexed | 2024-09-23T12:26:19Z |
| format | Thesis |
| id | mit-1721.1/32659 |
| institution | Massachusetts Institute of Technology |
| language | eng |
| last_indexed | 2024-09-23T12:26:19Z |
| publishDate | 2006 |
| publisher | Massachusetts Institute of Technology |
| record_format | dspace |
| spelling | mit-1721.1/326592019-04-10T18:25:21Z Misfit accomodation in thin films of Ni/Cu as measured by magnetic anisotropy Inglefield, Heather Elizabeth Carl V. Thompson. Massachusetts Institute of Technology. Dept. of Materials Science and Engineering Materials Science and Engineering Thesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Materials Science and Engineering, 1995. Includes bibliographical references (leaves 134-137). by Heather Elizabeth Inglefield. Ph.D. 2006-05-15T20:19:34Z 2006-05-15T20:19:34Z 1995 1995 Thesis http://hdl.handle.net/1721.1/32659 33328312 eng M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission. http://dspace.mit.edu/handle/1721.1/7582 137 leaves 6823267 bytes 6830220 bytes application/pdf application/pdf application/pdf Massachusetts Institute of Technology |
| spellingShingle | Materials Science and Engineering Inglefield, Heather Elizabeth Misfit accomodation in thin films of Ni/Cu as measured by magnetic anisotropy |
| title | Misfit accomodation in thin films of Ni/Cu as measured by magnetic anisotropy |
| title_full | Misfit accomodation in thin films of Ni/Cu as measured by magnetic anisotropy |
| title_fullStr | Misfit accomodation in thin films of Ni/Cu as measured by magnetic anisotropy |
| title_full_unstemmed | Misfit accomodation in thin films of Ni/Cu as measured by magnetic anisotropy |
| title_short | Misfit accomodation in thin films of Ni/Cu as measured by magnetic anisotropy |
| title_sort | misfit accomodation in thin films of ni cu as measured by magnetic anisotropy |
| topic | Materials Science and Engineering |
| url | http://hdl.handle.net/1721.1/32659 |
| work_keys_str_mv | AT inglefieldheatherelizabeth misfitaccomodationinthinfilmsofnicuasmeasuredbymagneticanisotropy |