Optoelectronic integration using the magnetically assisted statistical assembly technique : initial magnetic characterization and process development

Thesis (S.M.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 2002.

Bibliographic Details
Main Author: Rumpler, Joseph John, 1976-
Other Authors: Clifton G. Fonstad, Jr.
Format: Thesis
Language:eng
Published: Massachusetts Institute of Technology 2006
Subjects:
Online Access:http://hdl.handle.net/1721.1/32714
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author Rumpler, Joseph John, 1976-
author2 Clifton G. Fonstad, Jr.
author_facet Clifton G. Fonstad, Jr.
Rumpler, Joseph John, 1976-
author_sort Rumpler, Joseph John, 1976-
collection MIT
description Thesis (S.M.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 2002.
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spelling mit-1721.1/327142019-04-11T05:54:27Z Optoelectronic integration using the magnetically assisted statistical assembly technique : initial magnetic characterization and process development Rumpler, Joseph John, 1976- Clifton G. Fonstad, Jr. Massachusetts Institute of Technology. Dept. of Electrical Engineering and Computer Science. Massachusetts Institute of Technology. Dept. of Electrical Engineering and Computer Science. Electrical Engineering and Computer Science. Thesis (S.M.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 2002. Includes bibliographical references (p. 99-101). The commercial integration of optoelectronic devices heavily relies on hybrid techniques such as wire bonding and flip-chip bonding. These methods are limited in the scale and flexibility in integration. Research focused on optoelectronic integration is performed using numerous techniques such as direct epitaxy, full-scale wafer bonding, and self-assembly. Magnetically Assisted Statistical Assembly (MASA) is an example of the latter technique and improves scale and flexibility by enabling the simultaneous integration of large numbers of individual devices. This thesis work is focused on the demonstration of the MASA concept through characterization of the magnetic materials forming the foundation for this technique and development of an adequate process technology. Both, the magnetic characteristics and the process technology required to integrate the technology are presented along with results of the integration. by Joseph John Rumpler, II. S.M. 2006-05-15T20:24:30Z 2006-05-15T20:24:30Z 2002 2002 Thesis http://hdl.handle.net/1721.1/32714 51979480 eng M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission. http://dspace.mit.edu/handle/1721.1/7582 101 p. 5031671 bytes 5037181 bytes application/pdf application/pdf application/pdf Massachusetts Institute of Technology
spellingShingle Electrical Engineering and Computer Science.
Rumpler, Joseph John, 1976-
Optoelectronic integration using the magnetically assisted statistical assembly technique : initial magnetic characterization and process development
title Optoelectronic integration using the magnetically assisted statistical assembly technique : initial magnetic characterization and process development
title_full Optoelectronic integration using the magnetically assisted statistical assembly technique : initial magnetic characterization and process development
title_fullStr Optoelectronic integration using the magnetically assisted statistical assembly technique : initial magnetic characterization and process development
title_full_unstemmed Optoelectronic integration using the magnetically assisted statistical assembly technique : initial magnetic characterization and process development
title_short Optoelectronic integration using the magnetically assisted statistical assembly technique : initial magnetic characterization and process development
title_sort optoelectronic integration using the magnetically assisted statistical assembly technique initial magnetic characterization and process development
topic Electrical Engineering and Computer Science.
url http://hdl.handle.net/1721.1/32714
work_keys_str_mv AT rumplerjosephjohn1976 optoelectronicintegrationusingthemagneticallyassistedstatisticalassemblytechniqueinitialmagneticcharacterizationandprocessdevelopment