An automated bench testing system for direct current parameters of instrumentation amplifiers
Thesis (M. Eng.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 2005.
| Main Author: | |
|---|---|
| Other Authors: | |
| Format: | Thesis |
| Language: | eng |
| Published: |
Massachusetts Institute of Technology
2006
|
| Subjects: | |
| Online Access: | http://hdl.handle.net/1721.1/33328 |
| _version_ | 1826194762406821888 |
|---|---|
| author | Musah, Arthur |
| author2 | Mark Irwin and Stephen K. Burns. |
| author_facet | Mark Irwin and Stephen K. Burns. Musah, Arthur |
| author_sort | Musah, Arthur |
| collection | MIT |
| description | Thesis (M. Eng.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 2005. |
| first_indexed | 2024-09-23T10:01:23Z |
| format | Thesis |
| id | mit-1721.1/33328 |
| institution | Massachusetts Institute of Technology |
| language | eng |
| last_indexed | 2024-09-23T10:01:23Z |
| publishDate | 2006 |
| publisher | Massachusetts Institute of Technology |
| record_format | dspace |
| spelling | mit-1721.1/333282019-04-11T02:02:09Z An automated bench testing system for direct current parameters of instrumentation amplifiers Musah, Arthur Mark Irwin and Stephen K. Burns. Massachusetts Institute of Technology. Dept. of Electrical Engineering and Computer Science. Massachusetts Institute of Technology. Dept. of Electrical Engineering and Computer Science. Electrical Engineering and Computer Science. Thesis (M. Eng.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 2005. Includes bibliographical references (p. 92-93). Electrical testing is performed at multiple stages in the production of analog integrated circuits (ICs). An efficient system for low-volume IC testing is one that automates bench tests and provides good measurement precision and accuracy, while costing far less than the standard automated test equipment (ATE) used for high-volume manufacturing purposes. This thesis describes the design and implementation of an automated bench system for measuring the important direct current parameters associated with analog instrumentation amplifiers: voltage offset, input bias currents, input offset current, output swing, common mode rejection, power supply rejection, quiescent current and gain error. The system is developed on the PXI platform and consists of measurement and signal generating hardware modules, a Windows-based computer, a resource printed circuit board (PCB), a test-configuration PCB and LabVIEW-based software. The system is versatile and supports the testing of different instrumentation amplifier types and pin- outs. The performance of the system is characterized with respect to ATE results for the Texas Instruments instrumentation amplifier INA 126. by Arthur Musah. M.Eng. 2006-07-13T15:15:42Z 2006-07-13T15:15:42Z 2005 2005 Thesis http://hdl.handle.net/1721.1/33328 62324967 eng M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission. http://dspace.mit.edu/handle/1721.1/7582 93 p. 11744612 bytes 11748471 bytes application/pdf application/pdf application/pdf Massachusetts Institute of Technology |
| spellingShingle | Electrical Engineering and Computer Science. Musah, Arthur An automated bench testing system for direct current parameters of instrumentation amplifiers |
| title | An automated bench testing system for direct current parameters of instrumentation amplifiers |
| title_full | An automated bench testing system for direct current parameters of instrumentation amplifiers |
| title_fullStr | An automated bench testing system for direct current parameters of instrumentation amplifiers |
| title_full_unstemmed | An automated bench testing system for direct current parameters of instrumentation amplifiers |
| title_short | An automated bench testing system for direct current parameters of instrumentation amplifiers |
| title_sort | automated bench testing system for direct current parameters of instrumentation amplifiers |
| topic | Electrical Engineering and Computer Science. |
| url | http://hdl.handle.net/1721.1/33328 |
| work_keys_str_mv | AT musaharthur anautomatedbenchtestingsystemfordirectcurrentparametersofinstrumentationamplifiers AT musaharthur automatedbenchtestingsystemfordirectcurrentparametersofinstrumentationamplifiers |