Real time interferometric imaging of the plasma etch process

Thesis (M. Eng.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1994.

Bibliographic Details
Main Author: Claman, Jonathan L. (Jonathan Leonard)
Other Authors: Duane S. Boning.
Format: Thesis
Language:eng
Published: Massachusetts Institute of Technology 2007
Subjects:
Online Access:http://hdl.handle.net/1721.1/35386
_version_ 1826210020200546304
author Claman, Jonathan L. (Jonathan Leonard)
author2 Duane S. Boning.
author_facet Duane S. Boning.
Claman, Jonathan L. (Jonathan Leonard)
author_sort Claman, Jonathan L. (Jonathan Leonard)
collection MIT
description Thesis (M. Eng.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1994.
first_indexed 2024-09-23T14:39:57Z
format Thesis
id mit-1721.1/35386
institution Massachusetts Institute of Technology
language eng
last_indexed 2024-09-23T14:39:57Z
publishDate 2007
publisher Massachusetts Institute of Technology
record_format dspace
spelling mit-1721.1/353862019-04-11T05:54:30Z Real time interferometric imaging of the plasma etch process Claman, Jonathan L. (Jonathan Leonard) Duane S. Boning. Massachusetts Institute of Technology. Dept. of Electrical Engineering and Computer Science Electrical Engineering and Computer Science Thesis (M. Eng.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1994. Includes bibliographical references (leaves 51-52). by Jonathan L. Claman. M.Eng. 2007-01-10T15:59:26Z 2007-01-10T15:59:26Z 1994 1994 Thesis http://hdl.handle.net/1721.1/35386 31162756 eng M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission. http://dspace.mit.edu/handle/1721.1/7582 iv, 72 leaves 3838363 bytes 3841561 bytes application/pdf application/pdf application/pdf Massachusetts Institute of Technology
spellingShingle Electrical Engineering and Computer Science
Claman, Jonathan L. (Jonathan Leonard)
Real time interferometric imaging of the plasma etch process
title Real time interferometric imaging of the plasma etch process
title_full Real time interferometric imaging of the plasma etch process
title_fullStr Real time interferometric imaging of the plasma etch process
title_full_unstemmed Real time interferometric imaging of the plasma etch process
title_short Real time interferometric imaging of the plasma etch process
title_sort real time interferometric imaging of the plasma etch process
topic Electrical Engineering and Computer Science
url http://hdl.handle.net/1721.1/35386
work_keys_str_mv AT clamanjonathanljonathanleonard realtimeinterferometricimagingoftheplasmaetchprocess