Testing for time-dependent failures in electronic products
Thesis (M.S.)--Massachusetts Institute of Technology, Sloan School of Management, 1994, and Thesis (M.S.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering, 1994.
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| Format: | Thesis |
| Language: | eng |
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Massachusetts Institute of Technology
2007
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| Online Access: | http://hdl.handle.net/1721.1/35418 |
| _version_ | 1826208966325043200 |
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| author | Peterson, Michael L. (Michael Laurel) |
| author2 | Massachusetts Institute of Technology. Department of Electrical Engineering |
| author_facet | Massachusetts Institute of Technology. Department of Electrical Engineering Peterson, Michael L. (Michael Laurel) |
| author_sort | Peterson, Michael L. (Michael Laurel) |
| collection | MIT |
| description | Thesis (M.S.)--Massachusetts Institute of Technology, Sloan School of Management, 1994, and Thesis (M.S.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering, 1994. |
| first_indexed | 2024-09-23T14:15:15Z |
| format | Thesis |
| id | mit-1721.1/35418 |
| institution | Massachusetts Institute of Technology |
| language | eng |
| last_indexed | 2024-09-23T14:15:15Z |
| publishDate | 2007 |
| publisher | Massachusetts Institute of Technology |
| record_format | dspace |
| spelling | mit-1721.1/354182022-01-27T16:54:47Z Testing for time-dependent failures in electronic products Peterson, Michael L. (Michael Laurel) Massachusetts Institute of Technology. Department of Electrical Engineering Sloan School of Management Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science Sloan School of Management Electrical Engineering Thesis (M.S.)--Massachusetts Institute of Technology, Sloan School of Management, 1994, and Thesis (M.S.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering, 1994. Includes bibliographical references (p. 94-95). by Michael L. Peterson. M.S. 2007-01-10T16:05:09Z 2007-01-10T16:05:09Z 1994 1994 Thesis http://hdl.handle.net/1721.1/35418 31673724 eng M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission. http://dspace.mit.edu/handle/1721.1/7582 124 p. 7858627 bytes 8292284 bytes application/pdf application/pdf application/pdf Massachusetts Institute of Technology |
| spellingShingle | Sloan School of Management Electrical Engineering Peterson, Michael L. (Michael Laurel) Testing for time-dependent failures in electronic products |
| title | Testing for time-dependent failures in electronic products |
| title_full | Testing for time-dependent failures in electronic products |
| title_fullStr | Testing for time-dependent failures in electronic products |
| title_full_unstemmed | Testing for time-dependent failures in electronic products |
| title_short | Testing for time-dependent failures in electronic products |
| title_sort | testing for time dependent failures in electronic products |
| topic | Sloan School of Management Electrical Engineering |
| url | http://hdl.handle.net/1721.1/35418 |
| work_keys_str_mv | AT petersonmichaellmichaellaurel testingfortimedependentfailuresinelectronicproducts |