Simulating scanning tunneling microscope measurements
Thesis (S.B.)--Massachusetts Institute of Technology, Dept. of Physics, 2006.
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| Format: | Thesis |
| Language: | eng |
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Massachusetts Institute of Technology
2007
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| Online Access: | http://hdl.handle.net/1721.1/36116 |
| _version_ | 1811068293607325696 |
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| author | Venkatachalam, Vivek |
| author2 | Eric W. Hudson. |
| author_facet | Eric W. Hudson. Venkatachalam, Vivek |
| author_sort | Venkatachalam, Vivek |
| collection | MIT |
| description | Thesis (S.B.)--Massachusetts Institute of Technology, Dept. of Physics, 2006. |
| first_indexed | 2024-09-23T07:54:07Z |
| format | Thesis |
| id | mit-1721.1/36116 |
| institution | Massachusetts Institute of Technology |
| language | eng |
| last_indexed | 2024-09-23T07:54:07Z |
| publishDate | 2007 |
| publisher | Massachusetts Institute of Technology |
| record_format | dspace |
| spelling | mit-1721.1/361162019-04-09T15:25:17Z Simulating scanning tunneling microscope measurements Venkatachalam, Vivek Eric W. Hudson. Massachusetts Institute of Technology. Dept. of Physics. Massachusetts Institute of Technology. Dept. of Physics. Physics. Thesis (S.B.)--Massachusetts Institute of Technology, Dept. of Physics, 2006. Includes bibliographical references (leaf 25). One of the largest problems in scanning tunneling microscopy design is noise control. It is the burden of the designer to determine if money should be used to build a floating room for vibration isolation or for top-of-the-line preamplifiers that can be placed at low temperatures. This thesis presents a simulation of the STM measurement chain, from tunneling tip to computer control. The goal is to see how noise at different stages of the measurement chain affect the output of spectroscopy (density of states) measurements. Specifically, we look at how spectroscopy measurements depend on the temperature of the sample, the density of states in the sample and tip, the shakiness of the tip, the noise present in the current preamplifier, and several other settings. Chapter 1 describes STM spectroscopy measurement, Chapter 2 explains how it is simulated, and Chapter 3 finally looks at the results of various simulations. by Vivek Venkatachalam. S.B. 2007-02-21T11:27:44Z 2007-02-21T11:27:44Z 2006 2006 Thesis http://hdl.handle.net/1721.1/36116 71844429 eng M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission. http://dspace.mit.edu/handle/1721.1/7582 25 leaves application/pdf Massachusetts Institute of Technology |
| spellingShingle | Physics. Venkatachalam, Vivek Simulating scanning tunneling microscope measurements |
| title | Simulating scanning tunneling microscope measurements |
| title_full | Simulating scanning tunneling microscope measurements |
| title_fullStr | Simulating scanning tunneling microscope measurements |
| title_full_unstemmed | Simulating scanning tunneling microscope measurements |
| title_short | Simulating scanning tunneling microscope measurements |
| title_sort | simulating scanning tunneling microscope measurements |
| topic | Physics. |
| url | http://hdl.handle.net/1721.1/36116 |
| work_keys_str_mv | AT venkatachalamvivek simulatingscanningtunnelingmicroscopemeasurements |