Hot-carrier reliability evaluation for CMOS devices and circuits
Thesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1995.
| Main Author: | |
|---|---|
| Other Authors: | |
| Format: | Thesis |
| Language: | eng |
| Published: |
Massachusetts Institute of Technology
2007
|
| Subjects: | |
| Online Access: | http://hdl.handle.net/1721.1/36532 |
| _version_ | 1811082984147648512 |
|---|---|
| author | Chan, Vei-Han |
| author2 | James E. Chung. |
| author_facet | James E. Chung. Chan, Vei-Han |
| author_sort | Chan, Vei-Han |
| collection | MIT |
| description | Thesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1995. |
| first_indexed | 2024-09-23T12:16:36Z |
| format | Thesis |
| id | mit-1721.1/36532 |
| institution | Massachusetts Institute of Technology |
| language | eng |
| last_indexed | 2024-09-23T12:16:36Z |
| publishDate | 2007 |
| publisher | Massachusetts Institute of Technology |
| record_format | dspace |
| spelling | mit-1721.1/365322019-04-12T14:34:01Z Hot-carrier reliability evaluation for CMOS devices and circuits Chan, Vei-Han James E. Chung. Massachusetts Institute of Technology. Dept. of Electrical Engineering and Computer Science Electrical Engineering and Computer Science Thesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1995. Includes bibliographical references (p. 138-139). by Vei-Han Chan. Ph.D. 2007-03-12T17:28:22Z 2007-03-12T17:28:22Z 1995 1995 Thesis http://hdl.handle.net/1721.1/36532 32875610 eng M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission. http://dspace.mit.edu/handle/1721.1/7582 148 p. application/pdf Massachusetts Institute of Technology |
| spellingShingle | Electrical Engineering and Computer Science Chan, Vei-Han Hot-carrier reliability evaluation for CMOS devices and circuits |
| title | Hot-carrier reliability evaluation for CMOS devices and circuits |
| title_full | Hot-carrier reliability evaluation for CMOS devices and circuits |
| title_fullStr | Hot-carrier reliability evaluation for CMOS devices and circuits |
| title_full_unstemmed | Hot-carrier reliability evaluation for CMOS devices and circuits |
| title_short | Hot-carrier reliability evaluation for CMOS devices and circuits |
| title_sort | hot carrier reliability evaluation for cmos devices and circuits |
| topic | Electrical Engineering and Computer Science |
| url | http://hdl.handle.net/1721.1/36532 |
| work_keys_str_mv | AT chanveihan hotcarrierreliabilityevaluationforcmosdevicesandcircuits |