Modeling for hot-electron reliability simulation
Thesis (M. Eng.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1995.
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| Format: | Thesis |
| Language: | eng |
| Published: |
Massachusetts Institute of Technology
2007
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| Online Access: | http://hdl.handle.net/1721.1/36589 |
| _version_ | 1811083022426963968 |
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| author | Kim, SeokWon Abraham, 1970- |
| author2 | James E. Chung. |
| author_facet | James E. Chung. Kim, SeokWon Abraham, 1970- |
| author_sort | Kim, SeokWon Abraham, 1970- |
| collection | MIT |
| description | Thesis (M. Eng.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1995. |
| first_indexed | 2024-09-23T12:18:28Z |
| format | Thesis |
| id | mit-1721.1/36589 |
| institution | Massachusetts Institute of Technology |
| language | eng |
| last_indexed | 2024-09-23T12:18:28Z |
| publishDate | 2007 |
| publisher | Massachusetts Institute of Technology |
| record_format | dspace |
| spelling | mit-1721.1/365892019-04-12T15:59:10Z Modeling for hot-electron reliability simulation Kim, SeokWon Abraham, 1970- James E. Chung. Massachusetts Institute of Technology. Dept. of Electrical Engineering and Computer Science Electrical Engineering and Computer Science Thesis (M. Eng.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1995. Includes bibliographical references (leaves 74-78). by Jeffery Seokwon Kim. M.Eng. 2007-03-12T17:34:28Z 2007-03-12T17:34:28Z 1995 1995 Thesis http://hdl.handle.net/1721.1/36589 33349949 eng M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission. http://dspace.mit.edu/handle/1721.1/7582 88 leaves application/pdf Massachusetts Institute of Technology |
| spellingShingle | Electrical Engineering and Computer Science Kim, SeokWon Abraham, 1970- Modeling for hot-electron reliability simulation |
| title | Modeling for hot-electron reliability simulation |
| title_full | Modeling for hot-electron reliability simulation |
| title_fullStr | Modeling for hot-electron reliability simulation |
| title_full_unstemmed | Modeling for hot-electron reliability simulation |
| title_short | Modeling for hot-electron reliability simulation |
| title_sort | modeling for hot electron reliability simulation |
| topic | Electrical Engineering and Computer Science |
| url | http://hdl.handle.net/1721.1/36589 |
| work_keys_str_mv | AT kimseokwonabraham1970 modelingforhotelectronreliabilitysimulation |