Modeling for hot-electron reliability simulation

Modeling for hot-electron reliability simulation

Thesis (M. Eng.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1995.

Bibliographic Details
Main Author:	Kim, SeokWon Abraham, 1970-
Other Authors:	James E. Chung.
Format:	Thesis
Language:	eng
Published:	Massachusetts Institute of Technology 2007
Subjects:	Electrical Engineering and Computer Science
Online Access:	http://hdl.handle.net/1721.1/36589

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