Modeling for hot-electron reliability simulation
Thesis (M. Eng.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1995.
Main Author: | Kim, SeokWon Abraham, 1970- |
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Other Authors: | James E. Chung. |
Format: | Thesis |
Language: | eng |
Published: |
Massachusetts Institute of Technology
2007
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Subjects: | |
Online Access: | http://hdl.handle.net/1721.1/36589 |
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