Research on Polycrystalline Films for Micro- and Nano-Systems

Polycrystalline films are used in a wide array of micro- and nano-scale devices, for electronic, mechanical, magnetic, photonic and chemical functions. Increasingly, the properties, performance, and reliability of films in these systems depend on nano-scale structure. In collaborative research with...

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Main Author: Thompson, Carl V.
Format: Article
Language:en_US
Published: 2003
Subjects:
Online Access:http://hdl.handle.net/1721.1/3670
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author Thompson, Carl V.
author_facet Thompson, Carl V.
author_sort Thompson, Carl V.
collection MIT
description Polycrystalline films are used in a wide array of micro- and nano-scale devices, for electronic, mechanical, magnetic, photonic and chemical functions. Increasingly, the properties, performance, and reliability of films in these systems depend on nano-scale structure. In collaborative research with a number of SMA Fellows, Associates, and students, our group is carrying out research focused on probing, modeling and controlling nano-scale structural evolution during both vapor-phase and solid-phase polycrystalline film formation. In particular, high-sensitivity in-situ and real-time stress measurements are being used to study atomic scale forces and to characterize structure formation and evolution at the nano-scale. In other collaborative research, the affects of controlled structure and multi-film architectures on properties, such as piezoelectric characteristics and electromigration-limited reliability, are being explored. Through these interrelated activities, basic principles of the science and engineering of nano-scale materials are emerging.
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spelling mit-1721.1/36702019-04-12T08:06:44Z Research on Polycrystalline Films for Micro- and Nano-Systems Thompson, Carl V. interconnects MEMS stress thin films Polycrystalline films are used in a wide array of micro- and nano-scale devices, for electronic, mechanical, magnetic, photonic and chemical functions. Increasingly, the properties, performance, and reliability of films in these systems depend on nano-scale structure. In collaborative research with a number of SMA Fellows, Associates, and students, our group is carrying out research focused on probing, modeling and controlling nano-scale structural evolution during both vapor-phase and solid-phase polycrystalline film formation. In particular, high-sensitivity in-situ and real-time stress measurements are being used to study atomic scale forces and to characterize structure formation and evolution at the nano-scale. In other collaborative research, the affects of controlled structure and multi-film architectures on properties, such as piezoelectric characteristics and electromigration-limited reliability, are being explored. Through these interrelated activities, basic principles of the science and engineering of nano-scale materials are emerging. Singapore-MIT Alliance (SMA) 2003-11-10T20:18:14Z 2003-11-10T20:18:14Z 2003-01 Article http://hdl.handle.net/1721.1/3670 en_US Advanced Materials for Micro- and Nano-Systems (AMMNS); 315579 bytes application/pdf application/pdf
spellingShingle interconnects
MEMS
stress
thin films
Thompson, Carl V.
Research on Polycrystalline Films for Micro- and Nano-Systems
title Research on Polycrystalline Films for Micro- and Nano-Systems
title_full Research on Polycrystalline Films for Micro- and Nano-Systems
title_fullStr Research on Polycrystalline Films for Micro- and Nano-Systems
title_full_unstemmed Research on Polycrystalline Films for Micro- and Nano-Systems
title_short Research on Polycrystalline Films for Micro- and Nano-Systems
title_sort research on polycrystalline films for micro and nano systems
topic interconnects
MEMS
stress
thin films
url http://hdl.handle.net/1721.1/3670
work_keys_str_mv AT thompsoncarlv researchonpolycrystallinefilmsformicroandnanosystems