Imaging at the Nano-scale: State of the Art and Advanced Techniques
Surface characteristics such as topography and critical dimensions serve as important indicators of product quality and manufacturing process performance especially at the micrometer and the nanometer scales. This paper first reviews different technologies used for obtaining high precision 3-D image...
| Main Authors: | , , |
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| Format: | Article |
| Language: | en_US |
| Published: |
2003
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| Subjects: | |
| Online Access: | http://hdl.handle.net/1721.1/3745 |
| _version_ | 1826197910604218368 |
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| author | Aumond, Bernardo D. El Rifai, Osamah M. Youcef-Toumi, Kamal |
| author_facet | Aumond, Bernardo D. El Rifai, Osamah M. Youcef-Toumi, Kamal |
| author_sort | Aumond, Bernardo D. |
| collection | MIT |
| description | Surface characteristics such as topography and critical dimensions serve as important indicators of product quality and manufacturing process performance especially at the micrometer and the nanometer scales. This paper first reviews different technologies used for obtaining high precision 3-D images of surfaces, along with some selected applications. Atomic force microscopy (AFM) is one of such methods. These images are commonly distorted by convolution effects, which become more prominent when the sample surface contains high aspect ratio features. In addition, data artifacts can result from poor dynamic response of the instrument used. In order to achieve reliable data at high throughput, dynamic interactions between the instrument's components need to be well understood and controlled, and novel image deconvolution schemes need to be developed. Our work aims at mitigating these distortions and achieving reliable data to recover metrology soundness. A summary of our findings will be presented. |
| first_indexed | 2024-09-23T10:56:01Z |
| format | Article |
| id | mit-1721.1/3745 |
| institution | Massachusetts Institute of Technology |
| language | en_US |
| last_indexed | 2024-09-23T10:56:01Z |
| publishDate | 2003 |
| record_format | dspace |
| spelling | mit-1721.1/37452019-04-10T12:16:31Z Imaging at the Nano-scale: State of the Art and Advanced Techniques Aumond, Bernardo D. El Rifai, Osamah M. Youcef-Toumi, Kamal imaging atomic force microscope deconvolution stereo imaging piezoelectric model performance limitations scan parameters creep hysteresis calibration Surface characteristics such as topography and critical dimensions serve as important indicators of product quality and manufacturing process performance especially at the micrometer and the nanometer scales. This paper first reviews different technologies used for obtaining high precision 3-D images of surfaces, along with some selected applications. Atomic force microscopy (AFM) is one of such methods. These images are commonly distorted by convolution effects, which become more prominent when the sample surface contains high aspect ratio features. In addition, data artifacts can result from poor dynamic response of the instrument used. In order to achieve reliable data at high throughput, dynamic interactions between the instrument's components need to be well understood and controlled, and novel image deconvolution schemes need to be developed. Our work aims at mitigating these distortions and achieving reliable data to recover metrology soundness. A summary of our findings will be presented. Singapore-MIT Alliance (SMA) 2003-11-29T20:29:13Z 2003-11-29T20:29:13Z 2003-01 Article http://hdl.handle.net/1721.1/3745 en_US Innovation in Manufacturing Systems and Technology (IMST); 437498 bytes application/pdf application/pdf |
| spellingShingle | imaging atomic force microscope deconvolution stereo imaging piezoelectric model performance limitations scan parameters creep hysteresis calibration Aumond, Bernardo D. El Rifai, Osamah M. Youcef-Toumi, Kamal Imaging at the Nano-scale: State of the Art and Advanced Techniques |
| title | Imaging at the Nano-scale: State of the Art and Advanced Techniques |
| title_full | Imaging at the Nano-scale: State of the Art and Advanced Techniques |
| title_fullStr | Imaging at the Nano-scale: State of the Art and Advanced Techniques |
| title_full_unstemmed | Imaging at the Nano-scale: State of the Art and Advanced Techniques |
| title_short | Imaging at the Nano-scale: State of the Art and Advanced Techniques |
| title_sort | imaging at the nano scale state of the art and advanced techniques |
| topic | imaging atomic force microscope deconvolution stereo imaging piezoelectric model performance limitations scan parameters creep hysteresis calibration |
| url | http://hdl.handle.net/1721.1/3745 |
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