Imaging at the Nano-scale: State of the Art and Advanced Techniques
Surface characteristics such as topography and critical dimensions serve as important indicators of product quality and manufacturing process performance especially at the micrometer and the nanometer scales. This paper first reviews different technologies used for obtaining high precision 3-D image...
| Główni autorzy: | , , |
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| Format: | Artykuł |
| Język: | en_US |
| Wydane: |
2003
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| Hasła przedmiotowe: | |
| Dostęp online: | http://hdl.handle.net/1721.1/3745 |