Chung, Y., & Wuensch, B. J. (2007). Toward the measurement of reliable grain-boundary diffusion coefficients in oxides. Massachusetts Institute of Technology.
Chicago Style (17th ed.) CitationChung, Yong-Chae, and Bernhardt J. Wuensch. Toward the Measurement of Reliable Grain-boundary Diffusion Coefficients in Oxides. Massachusetts Institute of Technology, 2007.
MLA (9th ed.) CitationChung, Yong-Chae, and Bernhardt J. Wuensch. Toward the Measurement of Reliable Grain-boundary Diffusion Coefficients in Oxides. Massachusetts Institute of Technology, 2007.
Warning: These citations may not always be 100% accurate.