Effective use of test data for quality improvement and cycle time reduction in radio system manufacturing
Thesis (M.S.)--Massachusetts Institute of Technology, Sloan School of Management, 1995, and Thesis (M.S.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1995.
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| Other Authors: | |
| Format: | Thesis |
| Language: | eng |
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Massachusetts Institute of Technology
2007
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| Online Access: | http://hdl.handle.net/1721.1/38107 |
| _version_ | 1826201270638084096 |
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| author | Haag, Lance Edward |
| author2 | Steven D. Eppinger. |
| author_facet | Steven D. Eppinger. Haag, Lance Edward |
| author_sort | Haag, Lance Edward |
| collection | MIT |
| description | Thesis (M.S.)--Massachusetts Institute of Technology, Sloan School of Management, 1995, and Thesis (M.S.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1995. |
| first_indexed | 2024-09-23T11:48:59Z |
| format | Thesis |
| id | mit-1721.1/38107 |
| institution | Massachusetts Institute of Technology |
| language | eng |
| last_indexed | 2024-09-23T11:48:59Z |
| publishDate | 2007 |
| publisher | Massachusetts Institute of Technology |
| record_format | dspace |
| spelling | mit-1721.1/381072019-04-12T16:07:16Z Effective use of test data for quality improvement and cycle time reduction in radio system manufacturing Haag, Lance Edward Steven D. Eppinger. Massachusetts Institute of Technology. Dept. of Electrical Engineering and Computer Science Sloan School of Management Sloan School of Management Electrical Engineering and Computer Science Thesis (M.S.)--Massachusetts Institute of Technology, Sloan School of Management, 1995, and Thesis (M.S.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1995. Includes bibliographical references (leaves 66-67). by Lance Edward Haag. M.S. 2007-07-18T13:37:20Z 2007-07-18T13:37:20Z 1995 1995 Thesis http://hdl.handle.net/1721.1/38107 34296136 eng M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission. http://dspace.mit.edu/handle/1721.1/7582 68 leaves application/pdf Massachusetts Institute of Technology |
| spellingShingle | Sloan School of Management Electrical Engineering and Computer Science Haag, Lance Edward Effective use of test data for quality improvement and cycle time reduction in radio system manufacturing |
| title | Effective use of test data for quality improvement and cycle time reduction in radio system manufacturing |
| title_full | Effective use of test data for quality improvement and cycle time reduction in radio system manufacturing |
| title_fullStr | Effective use of test data for quality improvement and cycle time reduction in radio system manufacturing |
| title_full_unstemmed | Effective use of test data for quality improvement and cycle time reduction in radio system manufacturing |
| title_short | Effective use of test data for quality improvement and cycle time reduction in radio system manufacturing |
| title_sort | effective use of test data for quality improvement and cycle time reduction in radio system manufacturing |
| topic | Sloan School of Management Electrical Engineering and Computer Science |
| url | http://hdl.handle.net/1721.1/38107 |
| work_keys_str_mv | AT haaglanceedward effectiveuseoftestdataforqualityimprovementandcycletimereductioninradiosystemmanufacturing |