Substrate Resistance Extraction Using a Multi-Domain Surface Integral Formulation
In order to assess and optimize layout strategies for minimizing substrate noise, it is necessary to have fast and accurate techniques for computing contact coupling resistances associated with the substrate. In this talk, we describe an extraction method capable of full-chip analysis which combines...
| Main Authors: | , , |
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| פורמט: | Article |
| שפה: | en_US |
| יצא לאור: |
2003
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| נושאים: | |
| גישה מקוונת: | http://hdl.handle.net/1721.1/3923 |