Electrical degradation mechanisms of RF power GaAs PHEMTs

Electrical degradation mechanisms of RF power GaAs PHEMTs

Thesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 2007.

Bibliographic Details
Main Author:	Villanueva, Anita A. (Anita Ariel), 1978-
Other Authors:	Jesús A. del Alamo.
Format:	Thesis
Language:	eng
Published:	Massachusetts Institute of Technology 2008
Subjects:	Electrical Engineering and Computer Science.
Online Access:	http://hdl.handle.net/1721.1/40547

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