Electrical degradation mechanisms of RF power GaAs PHEMTs

Electrical degradation mechanisms of RF power GaAs PHEMTs

Thesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 2007.

Bibliographic Details
Main Author: Villanueva, Anita A. (Anita Ariel), 1978-
Other Authors: Jesús A. del Alamo.
Format: Thesis
Language:eng
Published: Massachusetts Institute of Technology 2008
Subjects:
Electrical Engineering and Computer Science.
Online Access:http://hdl.handle.net/1721.1/40547

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