A real-time three dimensional profiling depth from focus method
Thesis (M.S.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1994.
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Бусад зохиолчид: | |
Формат: | Дипломын ажил |
Хэл сонгох: | eng |
Хэвлэсэн: |
Massachusetts Institute of Technology
2008
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Нөхцлүүд: | |
Онлайн хандалт: | http://hdl.handle.net/1721.1/41329 |
Тойм: | Thesis (M.S.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1994. |
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